يعرض 1 - 10 نتائج من 55 نتيجة بحث عن '"Andrej Rumiantsev"', وقت الاستعلام: 0.80s تنقيح النتائج
  1. 1
    كتاب
    On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

    المؤلفون: Andrej Rumiantsev

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  2. 2
    Electrical Properties of Custom Standards

    المؤلفون: Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::124d3403c69ce8ab62769adc348c9798
    https://doi.org/10.1201/9781003338994-6

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  3. 3
    Sensitivity Analysis of Wafer-Level Over-Temperature RF Calibration

    المؤلفون: G. Fisher, Ralf Doerner, Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    مصطلحات موضوعية: Engineering, Observational error, business.industry, Calibration curve, Acoustics, Astrophysics::Instrumentation and Methods for Astrophysics, Repeatability, Range (statistics), Electronic engineering, Calibration, Wafer, Sensitivity (control systems), business, Order of magnitude

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::52c9ac9148d1126757f1ec6998b36d2e
    https://doi.org/10.1201/9781003338994-29

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  4. 4
    Attachment to Chapter 3

    المؤلفون: Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7a0617fc9541aad575d6a604dd462dad
    https://doi.org/10.1201/9781003338994-14

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  5. 5
    Attachment to Chapter 2

    المؤلفون: Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f9e1655375fad1a36f729bb1ad94f1ce
    https://doi.org/10.1201/9781003338994-13

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  6. 6
    Development of Calibration Solutions

    المؤلفون: Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::12f4d5bdcf4af8ad49a0f7e4f0b4b225
    https://doi.org/10.1201/9781003338994-4

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  7. 7
    Introduction

    المؤلفون: Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b07f3fe2e10fc7ba3bacf023ab21da41
    https://doi.org/10.1201/9781003338994-3

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  8. 8
    Selected Aspects of Measurement and Calibration Assurance

    المؤلفون: Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8376ad9cd6579e48736fba2fabb4e7c2
    https://doi.org/10.1201/9781003338994-10

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  9. 9
    Motivation

    المؤلفون: Andrej Rumiantsev

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::67f8e88b5704075254f62005fb31d0de
    https://doi.org/10.1201/9781003338994-2

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  10. 10
    Calibration Standards Verification Procedure Using the Calibration Comparison Technique

    المؤلفون: Ralf Doerner, Andrej Rumiantsev, Steffen Thies

    المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ISBN: 9781003338994

    مصطلحات موضوعية: Engineering, Worst case error, business.industry, Line (geometry), Calibration, Electronic engineering, NIST, business, Characteristic impedance, Verification procedure

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d2609a5f8e3723e3e6d4cb7935e40c4d
    https://doi.org/10.1201/9781003338994-20

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