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1دورية أكاديمية
المؤلفون: Andrew C Payne, Michael Andregg, Kent Kemmish, Mark Hamalainen, Charlotte Bowell, Andrew Bleloch, Nathan Klejwa, Wolfgang Lehrach, Ken Schatz, Heather Stark, Adam Marblestone, George Church, Christopher S Own, William Andregg
المصدر: PLoS ONE, Vol 8, Iss 7, p e69058 (2013)
وصف الملف: electronic resource
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المؤلفون: Ondrej L. Krivanek, Andrew Bleloch, Jordan A. Hachtel, Benjamin Plotkin-Swing, G.J. Corbin, M.V. Hoffman, C.E. Meyer, Juan C. Idrobo, N.J. Bacon, M.T. Hotz, Niklas Dellby, Tracy C. Lovejoy
المصدر: Ultramicroscopy. 203
مصطلحات موضوعية: 010302 applied physics, Materials science, Spectrometer, business.industry, Electron energy loss spectroscopy, Resolution (electron density), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, law, 0103 physical sciences, Scanning transmission electron microscopy, Optoelectronics, Electron microscope, 0210 nano-technology, business, Spectroscopy, Instrumentation, Image resolution, Monochromator
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المؤلفون: Benjamin Plotkin-Swing, G.J. Corbin, Z.S. Szilagyi, M.V. Hoffman, C.E. Meyer, Andreas Mittelberger, Tracy C. Lovejoy, P. Hrncirik, Ondrej L. Krivanek, Niklas Dellby, N. Johnson, Andrew Bleloch, N.J. Bacon, G.S. Skone, M.T. Hotz
المصدر: Microscopy and Microanalysis. 25:512-513
مصطلحات موضوعية: Software, Materials science, business.industry, Detector, Electronic engineering, business, Instrumentation
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المؤلفون: Andrew Bleloch, Tracy C. Lovejoy, Niklas Dellby, Chenglong Shi, Ondrej L. Krivanek, Wu Zhou
المصدر: Microscopy and Microanalysis. 24:18-19
مصطلحات موضوعية: Materials science, 0103 physical sciences, 02 engineering and technology, Limit (mathematics), 021001 nanoscience & nanotechnology, 010306 general physics, 0210 nano-technology, 01 natural sciences, Instrumentation, Image resolution, Computational physics
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المؤلفون: Ondrej L. Krivanek, Niklas Dellby, Andrew Bleloch, N.J. Bacon, Tracy C. Lovejoy, M.V. Hoffman
المصدر: Microscopy and Microanalysis. 23:1552-1553
مصطلحات موضوعية: Materials science, business.industry, 0103 physical sciences, Optoelectronics, 02 engineering and technology, 021001 nanoscience & nanotechnology, 010306 general physics, 0210 nano-technology, business, High energy resolution, 01 natural sciences, Instrumentation
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المصدر: Acta Materialia. 59:3519-3527
مصطلحات موضوعية: Materials science, Polymers and Plastics, Condensed matter physics, Scanning electron microscope, Metals and Alloys, chemistry.chemical_element, Yttrium, Intergranular corrosion, Microstructure, Dark field microscopy, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Creep, Ceramics and Composites, Grain boundary, Dislocation
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7
المؤلفون: Rik Brydson, Andy Brown, Andrew Bleloch, K Sader
المصدر: Ultramicroscopy. 110:1324-1331
مصطلحات موضوعية: Contrast transfer function, Materials science, business.industry, media_common.quotation_subject, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Field electron emission, Spherical aberration, Optics, Optical transfer function, Scanning transmission electron microscopy, Electron beam processing, Contrast (vision), business, High-resolution transmission electron microscopy, Instrumentation, media_common
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8
المؤلفون: Peng Wang, Andrew Bleloch, Matthew J. Rosseinsky, Carlos Bernuy-Lopez, John B. Claridge, Mathieu Allix, Bernard Raveau, Denis Pelloquin
المصدر: Solid State Ionics. 181:889-893
مصطلحات موضوعية: Chemistry, Crystal chemistry, Stacking, Oxide, General Chemistry, Condensed Matter Physics, Chemical formula, chemistry.chemical_compound, Crystallography, Transmission electron microscopy, Phase (matter), General Materials Science, Double perovskite, Crystallite
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9
المؤلفون: Ian M. Ross, Andrew Bleloch, C. R. Seabourne, Budhika G. Mendis, Peng Wang, W.M. Rainforth, P.Eh. Hovsepian, Christina Reinhard, Andrew J. Scott
المصدر: Thin Solid Films. 518:5121-5127
مصطلحات موضوعية: Electron density, Electron energy loss spectroscopy, Metals and Alloys, Analytical chemistry, Surfaces and Interfaces, Nitride, Sputter deposition, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Physical vapor deposition, Scanning transmission electron microscopy, Materials Chemistry, Surface layer, Chromium nitride
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المؤلفون: G Vaughan, Mhairi Gass, Rik Brydson, Andrew Bleloch, K Sader, Y Pan, Andy Brown
المصدر: Ultramicroscopy. 110:1020-1032
مصطلحات موضوعية: biology, Chemistry, Electron energy loss spectroscopy, Analytical chemistry, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Ferritin, Ferrihydrite, law, Transmission electron microscopy, Scanning transmission electron microscopy, Electron beam processing, biology.protein, Iron phosphate, Electron microscope, Instrumentation