المؤلفون: Gupta, N., Makosiej, A., Shrimali, H., Amara, A., Vladimirescu, A., Anghel, C.

المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 20:270-277 2021

المؤلفون: Silisteanu I., Anghel C. I.

المصدر: EPJ Web of Conferences, Vol 107, p 07004 (2016)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2100-014X

URL الوصول: https://doaj.org/article/2369b391ee8d43428eb915fcde756508

المؤلفون: Elisei-Iliescu, C., Paleologu, C., Benesty, J., Stanciu, C., Anghel, C., Ciochina, S.

المصدر: IEEE/ACM Transactions on Audio, Speech, and Language Processing IEEE/ACM Trans. Audio Speech Lang. Process. Audio, Speech, and Language Processing, IEEE/ACM Transactions on. 27(5):903-918 May, 2019

المؤلفون: Allen, GI, Amoroso, N, Anghel, C, Balagurusamy, V, Bare, CJ, Beaton, D, Bellotti, R, Bennett, DA, Boehme, KL, Boutros, PC, Caberlotto, L, Caloian, C, Campbell, F, Neto, EC, Chang, YC, Chen, BB, Chen, CY, Chien, TY, Clark, T, Das, S, Davatzikos, C, Deng, JY, Dillenberger, D, Dobson, RJB, Dong, QL, Doshi, J, Duma, D, Errico, R, Erus, G, Everett, E, Fardo, DW, Friend, SH, Frohlich, H, Gan, J, St George-Hyslop, P, Ghosh, SS, Glaab, E, Green, RC, Guan, YF, Hong, MY, Huang, C, Hwang, J, Ibrahim, J, Inglese, P, Iyappan, A, Jiang, QJ, Katsumata, Y, Kauwe, JSK, Klein, A, Kong, D, Krause, R, Lalonde, E, Lauria, M, Lee, E, Lin, XH, Liu, ZD, Livingstone, J, Logsdon, BA, Lovestone, S, Ma, TW, Malhotra, A, Mangravite, LM, Maxwell, TJ, Merrill, E, Nagorski, J, Namasivayam, A, Narayan, M, Naz, M, Newhouse, SJ, Norman, TC, Nurtdinov, RN, Oyang, YJ, Pawitan, Y, Peng, SW, Peters, MA, Piccolo, SR, Praveen, P, Priami, C, Sabelnykova, VY, Senger, P, Shen, X, Simmons, A, Sotiras, A, Stolovitzky, G, Tangaro, S, Tateo, A, Tung, YA, Tustison, NJ, Varol, E, Vradenburg, G, Weiner, MW, Xiao, GH, Xie, L, Xie, Y, Xu, J, Yang, HJ, Zhan, XW, Zhou, YY, Zhu, F, Zhu, HT, Zhu, SF

المصدر: Alzheimer's & dementia : the journal of the Alzheimer's Association. 12(6):645-653

مصطلحات موضوعية: Medicin och hälsovetenskap

URL الوصول: http://kipublications.ki.se/Default.aspx?queryparsed=id:133733845

المؤلفون: Gupta, N., Makosiej, A., Thomas, O., Amara, A., Vladimirescu, A., Anghel, C.

المصدر: 2015 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2015 IEEE International Symposium on. :597-600 May, 2015

Relation: 2015 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Gupta, N., Makosiej, A., Thomas, O., Amara, A., Vladimirescu, A., Anghel, C.

المصدر: EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on. :209-212 Jan, 2015

Relation: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

المؤلفون: Hraziia, Amara, A., Vladimirescu, A., Anghel, C., Thomas, O.

المصدر: 2014 IEEE Faible Tension Faible Consommation Faible Tension Faible Consommation (FTFC), 2014 IEEE. :1-4 May, 2014

Relation: 2014 IEEE Faible Tension Faible Consommation (FTFC)

المؤلفون: Bartis, M., Mocanu, V., Enescu, A. A., Anghel, C.

المصدر: 2010 9th International Symposium on Electronics and Telecommunications Electronics and Telecommunications (ISETC), 2010 9th International Symposium on. :129-132 Nov, 2010

Relation: 2010 9th International Symposium on Electronics and Telecommunications (ISETC)

المؤلفون: Anghel, C., Chauhan, Y.S., Hefyene, N., Ionescu, A.M.

المصدر: Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. Industrial electronics Industrial Electronics, 2005. ISIE 2005. Proceedings of the IEEE International Symposium on. 2:473-477 vol. 2 2005

Relation: Proceedings of the IEEE International Symposium on Industrial Electronics

المؤلفون: Hefyene, N., Anghel, C., Gillon, R., Ionescu, A.M.

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :551-554 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual