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المؤلفون: Narendra Parihar, Goutham Arutchelvan, Jacopo Franco, Sylvain Baudot, Ann Opedebeeck, Steven Demuynck, Hiroaki Arimura, Lars-Ake Ragnarsson, Jerome Mitard, Vincent De Heyn, Abdelkarim Mercha
المصدر: 2021 IEEE International Integrated Reliability Workshop (IIRW).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::379c0969b9f758c2c5cea0b7c7f20ab2
https://doi.org/10.1109/iirw53245.2021.9635605