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المؤلفون: Simon Van Beek, Kaiming Cai, Kaiquan Fan, Giacomo Talmelli, Anna Trovato, Nico Jossart, Siddharth Rao, Adrian Chasin, Sebastien Couet
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a7056d443235cc4d21c8730e104e445f
https://doi.org/10.1109/irps48203.2023.10117917