-
1
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29:2064-2075
مصطلحات موضوعية: Counterfeit integrated circuits (ICs), Materials science, hot carrier injection (HCI) and bias temperature instability (BTI), Differential (mechanical device), Subthreshold leakage current, Integrated circuit, subthreshold leakage current, law.invention, Reliability (semiconductor), recycled ICs, Hardware and Architecture, law, Electronic engineering, Electrical and Electronic Engineering, ICs aging effects, Electronic systems, Software, Degradation (telecommunications), Hot-carrier injection, Voltage
-
2
المصدر: IOLTS
مصطلحات موضوعية: Mean time between failures, education.field_of_study, Computer science, business.industry, Population, Reliability engineering, Reliability (semiconductor), CMOS, Benchmark (computing), Microelectronics, Node (circuits), education, business, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ce95e54316569b7131c556da5c3ec078
https://doi.org/10.1109/iolts50870.2020.9159742