المؤلفون: Nabamita Chaudhury, Tanusri Biswas, Koushik Bose, Prabir Sengupta, Arghya Nath, Nivedita Mukherjee, Anupam Basu, Subhra Kanti Mukhopadhyay

المصدر: Journal of Pure and Applied Microbiology, Vol 17, Iss 4, Pp 2281-2294 (2023)

مصطلحات موضوعية: human papillomaviruses, molecular techniques, hpv16, hpv18, risk factors, Microbiology, QR1-502

وصف الملف: electronic resource

Relation: https://microbiologyjournal.org/prevalence-and-risk-assessment-of-human-papillomavirus-infection-in-a-bengali-cohort/; https://doaj.org/toc/0973-7510; https://doaj.org/toc/2581-690X

URL الوصول: https://doaj.org/article/23f596c798e3444db445e6c1379f0542

المؤلفون: • Suma Nayek, Sourav Sau, • Kaushik Majumdar, Anupam Basu, Arghya Bandyopadhyay

المصدر: Archives of Breast Cancer, Vol 9, Iss 2 (2022)

مصطلحات موضوعية: Tumor draining lymph nodes (TDLN), histology, PD1 immunohistochemistry, breast carcinoma, Neoplasms. Tumors. Oncology. Including cancer and carcinogens, RC254-282

وصف الملف: electronic resource

Relation: https://www.archbreastcancer.com/index.php/abc/article/view/495; https://doaj.org/toc/2383-0433

URL الوصول: https://doaj.org/article/9a99090e341840f6b36e4e88bf1aefa0

المؤلفون: Suma Nayek, Sourav Sau, Kaushik Majumdar, Anupam Basu, Arghya Bandyopadhyay

المصدر: Archives of Breast Cancer, Vol 9, Iss 2 (2022)

مصطلحات موضوعية: Tumor draining lymph nodes (TDLN), histology, PD1 immunohistochemistry, breast carcinoma, Neoplasms. Tumors. Oncology. Including cancer and carcinogens, RC254-282

وصف الملف: electronic resource

Relation: https://archbreastcancer.com/index.php/abc/article/view/495; https://doaj.org/toc/2383-0433

URL الوصول: https://doaj.org/article/c4f650e8be174a36ab1a641fbb55169e

المؤلفون: Aradhana Singh, Ranjitsinh Devkar, Anupam Basu

المصدر: Frontiers in Oncology, Vol 10 (2020)

مصطلحات موضوعية: TLR3, MyD88, cancer, breast cancer, Poly(I:C), IRAK1, Neoplasms. Tumors. Oncology. Including cancer and carcinogens, RC254-282

وصف الملف: electronic resource

Relation: https://www.frontiersin.org/article/10.3389/fonc.2020.01780/full; https://doaj.org/toc/2234-943X

URL الوصول: https://doaj.org/article/5abd38db0f134d4eab027e861ab47733

المؤلفون: Michael Gottlieb, MD, Damali Nakitende, MD, Laurie Krass, MD, Anupam Basu, MD, Errick Christian, MA, John Bailitz, MD

المصدر: Western Journal of Emergency Medicine, Vol 17, Iss 1, Pp 35-38 (2016)

مصطلحات موضوعية: shoulder dislocation, radiograph, xray, fractures, post-reduction, Medicine, Medical emergencies. Critical care. Intensive care. First aid, RC86-88.9

وصف الملف: electronic resource

Relation: http://escholarship.org/uc/item/0zk8c264; https://doaj.org/toc/1936-900X; https://doaj.org/toc/1936-9018

URL الوصول: https://doaj.org/article/dadf9482e77e4f66b4d6feaab04fd1dc

المؤلفون: Paromita Deb (ORCID 0000-0001-7546-9805), Anupam Basu

المصدر: Journal of Psycholinguistic Research. 2024 53(1).

Peer Reviewed: Y

Descriptors: Foreign Countries, Children, Comprehension, Reading Skills, Language Fluency, Verbal Communication, Word Recognition, Correlation, Semantics, Phonology, Psycholinguistics, Spatial Ability, Cognitive Processes, Difficulty Level

مصطلحات جغرافية: India

المؤلفون: Tirthankar Dasgupta, Anupam Basu, Animesh Das, Promathesh Mandal

المصدر: 2010 IEEE Students Technology Symposium (TechSym) Students' Technology Symposium (TechSym), 2010 IEEE. :248-254 Apr, 2010

Relation: 2010 IEEE Students Technology Symposium (TechSym)

المؤلفون: Sumit Das, Anupam Basu, Sudeshna Sarkar

المصدر: 2010 IEEE Students Technology Symposium (TechSym) Students' Technology Symposium (TechSym), 2010 IEEE. :305-311 Apr, 2010

Relation: 2010 IEEE Students Technology Symposium (TechSym)

المؤلفون: Debmalya Sinha, Sandipan Mandal, Anupam Basu

المصدر: 2010 IEEE Students Technology Symposium (TechSym) Students' Technology Symposium (TechSym), 2010 IEEE. :318-324 Apr, 2010

Relation: 2010 IEEE Students Technology Symposium (TechSym)

المؤلفون: Sunandan Chakraborty, Devshri Roy, Kumar Bhowmick, Plaban, Anupam Basu

المصدر: 2010 IEEE Students Technology Symposium (TechSym) Students' Technology Symposium (TechSym), 2010 IEEE. :196-205 Apr, 2010

Relation: 2010 IEEE Students Technology Symposium (TechSym)