المؤلفون: Bernardi, P., Cardone, L., Iaria, G., Appello, D., Garozzo, G., Tancorre, V.

المصدر: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2023 IEEE 29th International Symposium on. :1-7 Jul, 2023

Relation: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)

المؤلفون: Angione, F., Appello, D., Bernardi, P., Bertani, C., Gallo, G., Littardi, S., Pollaccia, G., Ruggeri, W., Reorda, M.S., Tancorre, V., Ugioli, R.

المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 72(5):1447-1459 May, 2023

المؤلفون: Angione, F., Appello, D., Bernardi, P., Calabrese, A., Quer, S., Reorda, M.S., Tancorre, V., Ugioli, R.

المصدر: IEEE Access Access, IEEE. 11:105655-105676 2023

المؤلفون: Iaria, G., Angione, F., Bernardi, P., Reorda, M. Sonza, Appello, D., Garozzo, G., Tancorre, V.

المصدر: 2022 IEEE 23rd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2022 IEEE 23rd. :1-6 Sep, 2022

Relation: 2022 IEEE 23rd Latin American Test Symposium (LATS)

المؤلفون: Filipponi, G., Iaria, G., Reorda, M. Sonza, Appello, D., Garozzo, G., Tancorre, V.

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :646-649 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Angione, F., Bernardi, P., Calabrese, A., Cardone, L., Niccoletti, A., Piumatti, D., Quer, S., Appello, D., Tancorre, V., Ugioli, R.

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :355-364 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Iaria, G., Foscale, T., Bernardi, P., Presicce, L., Reorda, M. Sonza, Appello, D., Tancorre, V., Ugioli, R.

المصدر: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2022 IEEE 31st International Symposium on. :623-626 Jun, 2022

Relation: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)

المؤلفون: Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., Reorda, M. Sonza, Sterpone, L., Tancorre, V., Ugioli, R.

المصدر: 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-10 May, 2022

Relation: 2022 IEEE European Test Symposium (ETS)

المؤلفون: Angione, F., Bernardi, P., Filipponi, G., Reorda, M. Sonza, Appello, D., Tancorre, V., Ugioli, R.

المصدر: 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-6 May, 2022

Relation: 2022 IEEE European Test Symposium (ETS)

المؤلفون: Appello, D., Bernardi, P., Calabrese, A., Pollaccia, G., Quer, S., Tancorre, V., Ugioli, R.

المصدر: IEEE Access Access, IEEE. 10:56440-56457 2022