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المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31:296-309
مصطلحات موضوعية: Hardware and Architecture, Electrical and Electronic Engineering, Software
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المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:5657-5670
مصطلحات موضوعية: Electrical and Electronic Engineering, Computer Graphics and Computer-Aided Design, Software
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المؤلفون: Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty, Arjun Chaudhuri
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:2348-2361
مصطلحات موضوعية: Computer science, media_common.quotation_subject, Code coverage, CPU time, Parallel computing, Automatic test pattern generation, Fault (power engineering), Computer Graphics and Computer-Aided Design, Reduction (complexity), Debugging, Electrical and Electronic Engineering, Cycle count, Control logic, Software, media_common
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المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
المصدر: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d55341bf2d2ce015acdd339295de4b0
https://doi.org/10.1145/3508352.3561121 -
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المؤلفون: Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
المصدر: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7eb2c88ebdc745080fe0055c93c112e3
https://doi.org/10.1109/iolts56730.2022.9897773 -
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المصدر: 2022 IEEE International Test Conference (ITC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4c42aabba900568d25cd0424e33752df
https://doi.org/10.1109/itc50671.2022.00019 -
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المصدر: 2022 IEEE International Test Conference (ITC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ce768c05af97237ca1e1c445582db284
https://doi.org/10.1109/itc50671.2022.00022 -
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المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
المصدر: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c4f0290a72991abfaf18412bd60afcb1
https://doi.org/10.1109/isvlsi54635.2022.00074 -
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المؤلفون: Jonti Talukdar, Arjun Chaudhuri, Krishnendu Chakrabarty
المصدر: 2022 IEEE European Test Symposium (ETS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3abfb46166bf611c26608b38c51e1426
https://doi.org/10.1109/ets54262.2022.9810399