المؤلفون: Shigyo, N., Tanimoto, H., Morishita, T., Sugawara, K., Wakita, N., Asahi, Y.

المصدر: IWSM. 1998 3rd International Workshop on Statistical Metrology (Cat. No.98EX113) Statistical metrology Statistical Metrology, 1998. 3rd International Workshop on. :10-13 1998

Relation: IWSM. 1998 3rd International Workshop on Statistical Metrology

المؤلفون: Bufler, F.M., Asahi, Y., Yoshimura, H., Zechner, C., Schenk, A., Fichtner, W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 50(2):418-424 Feb, 2003

المؤلفون: Asahi, Y., Latu, G., Ina, T., Idomura, Y., Grandgirard, V., Garbet, X.

المصدر: IEEE Transactions on Parallel and Distributed Systems IEEE Trans. Parallel Distrib. Syst. Parallel and Distributed Systems, IEEE Transactions on. 28(7):1974-1988 Jul, 2017

المؤلفون: Donnel, P., Garbet, X., Sarazin, Y., Grandgirard, V., Asahi, Y., Bouzat, N., Caschera, E., Dif-Pradalier, G., Ehrlacher, C., Ghendrih, P., Gillot, C., Latu, G., Passeron, C.

المصدر: In Computer Physics Communications January 2019 234:1-13

المؤلفون: Shibata, H., Ikeda, N., Nagamatsu, M., Asahi, Y., Maeguchi, K.

المصدر: Seventh International IEEE Conference on VLSI Multilevel Interconnection VLSI Multilevel Interconnection Conference, 1990. Proceedings., Seventh International IEEE. :15-20 1990

Relation: Seventh International IEEE Conference on VLSI Multilevel Interconnection

المؤلفون: Yoshimura, H., Asahi, Y., Matsuoka, F.

المصدر: 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184) VLSI technology VLSI Technology, 2001. Digest of Technical Papers. 2001 Symposium on. :143-144 2001

Relation: 2001 Symposium on VLSI Technology

المؤلفون: Oishi, A., Hasumi, R., Okayama, Y., Miyashita, K., Oowada, M., Aota, S., Nakayama, T., Matsumoto, M., Inada, N., Hiraoka, T., Yoshimura, H., Asahi, Y., Takegawa, Y., Yoshida, T., Sunouchi, K., Yasumoto, A., Tateshita, Y., Ueshima, M., Morikawa, T., Umebayashi, T., Gocho, T., Matsuoka, F., Noguchi, T., Kakumu, M.

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :22.4.1-22.4.4 2001

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Yoshida, T., Yamashita, K. ^*, Watanabe, M., Koshizuka, Y., Kuraya, D., Ogura, M., Asahi, Y., Ono, H., Emoto, S., Mizukami, T., Kobayashi, N., Shibasaki, S., Tomaru, U., Kamachi, H., Matsushita, M., Shiozawa, S., Hirono, S., Todo, S. ^*

المصدر: In American Journal of Transplantation October 2015 15(10):2565-2575

المؤلفون: Shibata, H., Ikeda, N., Murota, M., Asahi, Y., Hashimoto, K.

المصدر: 1991 Symposium on VLSI Technology VLSI Technology, 1991. Digest of Technical Papers., 1991 Symposium on. :33-34 1991

Relation: 1991 Symposium on VLSI Technology

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