المؤلفون: Wu, C., Reep, T., Brems, S., Yudistira, D., Van Campenhout, J., Asselberghs, I., Huyghebaert, C., Pantouvaki, M., Wang, Z., Van Thourhout, D.

المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 30(4: Adv. Mod. and Int. beyond Si and InP-based Plt.):1-11 Aug, 2024

المؤلفون: Dorow, C. J., Schram, T., Smets, Q., O'Brien, K. P., Maxey, K., Lin, C.-C., Panarella, L., Kaczer, B., Arefin, N., Roy, A., Jordan, R., Oni, A., Penumatcha, A., Naylor, C. H., Kavrik, M., Cott, D., Graven, B., Afanasiev, V., Morin, P., Asselberghs, I., Lockhart de La Rosa, C. J., Sankar Kar, G., Metz, M., Avci, U.

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Panarella, L., Kaczer, B., Smets, Q., Verreck, D., Schram, T., Cott, D., Lin, D., Tyaginov, S., Asselberghs, I., de la Rosa, C. Lockhart, Kar, G. S., Afanas'ev, V.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Ghosh, S., Smets, Q., Banerjee, S., Schram, T., Kennes, K., Verheyen, R., Kumar, P., Boulon, M.-E., Groven, B., Silva, H. M., Kundu, S., Cott, D., Lin, D., Favia, P., Nuytten, T., Phommahaxay, A., Asselberghs, I., De La Rosa, C., Kar, G. S., Brems, S.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Kundu, S., Van Dorp, D.H., Schram, T., Smets, Q., Banerjee, S., Groven, B., Cott, D., Decoster, S., Bezard, P., Lazzarino, F., Banerjee, K., Ghosh, S., De Marneffe, J.F., Morin, P., De La Rosa, C.J.L., Asselberghs, I., Kar, G.S.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Meng, F., Lee, S. -Y., Zografos, O., Gupta, M., Nguyen, V. D., De Micheli, G., Cotofana, S., Asselberghs, I., Adelmann, C., Kar, G. Sankar, Couet, S., Ciubotaru, F.

مصطلحات موضوعية: Physics - Applied Physics, Computer Science - Emerging Technologies

URL الوصول: http://arxiv.org/abs/2209.01999

المؤلفون: Panarella, L., Smets, Q., Verreck, D., Schram, T., Cott, D., Asselberghs, I., Kaczer, B.

المصدر: 2022 Device Research Conference (DRC) Device Research Conference (DRC), 2022. :1-2 Jun, 2022

Relation: 2022 Device Research Conference (DRC)

المؤلفون: Raymenants, E., Wan, D., Couet, S., Souriau, L., Thiam, A., Tsvetanova, D., Canvel, Y., Garello, K., Kar, G.S., Heyns, M., Asselberghs, I., Nikonov, D.E., Young, I.A., Pizzini, S., Radu, I., Dai Nguyen, V.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2116-2122 Apr, 2021

المؤلفون: Nashed, R., Pan, C., Wu, X., Asselberghs, I., Tokei, Z., Catthoor, F., Naeemi, A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(2):627-632 Feb, 2020

المؤلفون: Lin, D., Wu, X., Mootheri, V., Cott, D., Groven, B., Morin, P., Asselberghs, I., Radu, I.

المصدر: 2021 Device Research Conference (DRC) Device Research Conference (DRC), 2021. :1-2 Jun, 2021

Relation: 2021 Device Research Conference (DRC)