-
1
المؤلفون: Philippe Hurat, Ya-Chieh Lai, Atul Chittora, Jeffrey E. Nelson, Xiaoyuan Qi, Rwik Sengupta, Binod Kumar G. Nair, Aaron Sinnott, Frank E. Gennari, Jac Condella, Jonathan Fales, Shobhit Malik
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Adaptive sampling, Computer science, law, Yield (finance), Transistor, Process (computing), Normalization (sociology), Critical area, Projection (set theory), Failure mode and effects analysis, Reliability engineering, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e31d2dd7cd19fd6f640897511ffa93f0
https://doi.org/10.1117/12.2583515 -
2
المؤلفون: Neerja Bawaskar, Fadi Batarseh, Davide Pacifico, Atul Chittora, Shenghua Song, Monisa Ramesh Babu, Shobhit Malik, Janam Bakshi
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Computer science, business.industry, Pattern analysis, Pattern recognition, Artificial intelligence, business, Fault detection and isolation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1eb74727b7dd90ec74ef311d74d9c631
https://doi.org/10.31399/asm.cp.istfa2020p0352 -
3
المؤلفون: Sudhakar M. Reddy, Randy Klingenberg, Manish Sharma, Yue Tian, Geir Eide, Atul Chittora, Wu-Tung Cheng, Yan Pan, Sherwin Fernandes, Wu Yang, Brady Benware
المصدر: ATS
مصطلحات موضوعية: 0209 industrial biotechnology, genetic structures, business.industry, Computer science, Pattern recognition, 02 engineering and technology, Overfitting, Root cause, 020202 computer hardware & architecture, 020901 industrial engineering & automation, Feature (computer vision), 0202 electrical engineering, electronic engineering, information engineering, Algorithm design, Artificial intelligence, Pattern matching, Deconvolution, Root cause analysis, business, Cluster analysis
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1cb18c5bb97d2109617e2597ffdae1a4
https://doi.org/10.1109/ats.2017.49 -
4
المؤلفون: Atul Chittora, John Carulli, Yan Pan, Sherwin Fernandes, Rao Desineni, Neerja Bawaskar, Kannan Sekar
المصدر: ITC
مصطلحات موضوعية: Engineering, Engineering drawing, business.industry, Manufacturing process, Volume (computing), 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, 010309 optics, Identification (information), Software, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Systems engineering, Pylon, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3dfd8b0119223fde12e2594e6bfab153
https://doi.org/10.1109/test.2016.7805872 -
5
المؤلفون: Yan Pan, Kannan Sekar, Atul Chittora, Shobhit Malik, Lim Seng Keat
المصدر: 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).
مصطلحات موضوعية: Engineering, Design data, business.industry, Yield (finance), Perspective (graphical), Volume (computing), sort, Failure rate, business, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1e1d7dd86809732c983fd3cd8188bfe3
https://doi.org/10.1109/asmc.2014.6846948 -
6
المؤلفون: Jeffrey Lam, You Guo Feng, Goh Szu Huat, Kannan Sekar, Yan Pan, Avinash Viswanatha, Atul Chittora
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Engineering, Yield (engineering), business.industry, Deconvolution analysis, Electronic engineering, Root cause, business, Process engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::efb03acb3118f1a24bda83c3a59a52c1
https://doi.org/10.31399/asm.cp.istfa2013p0602 -
7
المؤلفون: Chuan Zhang, Atul Chittora, Ma Yinzhe, Sekar Kannan, Yan Pan, Jeffrey Lam, Oh Chong Khiam, Goh Szu Huat, Nyi Ohnmar, Lim Seng Keat, Don Nedeau
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Computer science, Failure diagnosis, Processing cost, Operations management, Voltage contrast, Selection (genetic algorithm), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::59616626ef39f46c06f7696ee5139864
https://doi.org/10.31399/asm.cp.istfa2013p0040