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المؤلفون: Jonathan Pradelles, Loïc Perraud, Elie Sezestre, Aulrélien Fay, Nivea G. Schuch, Thiago Figueiro, Frederic Robert
المصدر: Metrology, Inspection, and Process Control XXXVII.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f8c483660fc6fe771ce358996caeeea4
https://doi.org/10.1117/12.2658426