المؤلفون: B Moeckly, Vladimir Matias, J.Y. Coulter, David W. Reagor, Chris J. Sheehan

المصدر: IEEE Transactions on Applied Superconductivity. 21:2961-2964

مصطلحات موضوعية: Materials science, business.industry, Superconducting magnet, Chemical vapor deposition, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Chemical-mechanical planarization, Physical vapor deposition, Optoelectronics, Deposition (phase transition), Electrical and Electronic Engineering, business, Ion beam-assisted deposition, Layer (electronics), Electrical conductor

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d199a7d5a560cddab9d0e601e8730abb
https://doi.org/10.1109/tasc.2010.2092730

المؤلفون: B. Lakew, Shahid Aslam, David Franz, John C. Brasunas, H. Jones, B. Moeckly

المصدر: Physica C: Superconductivity. 440:1-5

مصطلحات موضوعية: Superconductivity, Materials science, Condensed matter physics, Noise spectral density, Bolometer, Energy Engineering and Power Technology, Substrate (electronics), Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Background noise, chemistry.chemical_compound, chemistry, law, Magnesium diboride, Electrical and Electronic Engineering, Thin film, Noise (radio)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a42c46ead44bce12640ff061982dc512
https://doi.org/10.1016/j.physc.2006.03.043

المؤلفون: B. Moeckly, Eva Olsson, M. Gustafsson

المصدر: Journal of Low Temperature Physics. 117:581-585

مصطلحات موضوعية: Josephson effect, Conventional transmission electron microscope, Plasma etching, Materials science, business.industry, Electron energy loss spectroscopy, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Transmission electron microscopy, Scanning transmission electron microscopy, Microscopy, Energy filtered transmission electron microscopy, Optoelectronics, General Materials Science, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5f3dc402d8292e9627b90c4f19a7b812
https://doi.org/10.1023/a:1022543800427

المؤلفون: V. BRACCINI, A. GUREVICH, M. C. JEWELL, C. B. EOM, D. C. LARBALESTIER, A. POGREBNYAKOV, Y. CUI, B. T. LIU, Y. F. HU, J. M. REDWING, QI LI, X. X. XI, R. K. SINGH, R. GANDIKOTA, J. KIM, B. WILKENS, N. NEWMAN, J. ROWELL, B. MOECKLY, V. FERRANDO, C. TARANTINI, D. MARR, M. PUTTI, C. FERDEGHINI, E. HAANAPPEL, VAGLIO, RUGGERO

المساهمون: V., Braccini, A., Gurevich, Vaglio, Ruggero, M. C., Jewell, C. B., Eom, D. C., Larbalestier, A., Pogrebnyakov, Y., Cui, B. T., Liu, Y. F., Hu, J. M., Redwing, Qi, Li, X. X., Xi, R. K., Singh, R., Gandikota, J., Kim, B., Wilken, N., Newman, J., Rowell, B., Moeckly, V., Ferrando, C., Tarantini, D., Marr, M., Putti, C., Ferdeghini, E., Haanappel

وصف الملف: STAMPA

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______3730::d9002cd2add1e0098ddddf2795c1bd1c
http://hdl.handle.net/11588/112432

المؤلفون: B. Moeckly, Judith L. MacManus-Driscoll, N. J. Montgomery, Richard J. Chater, David S. McPhail, K. Char

المصدر: Thin Solid Films. 317:237-240

مصطلحات موضوعية: Ion beam, Resolution (mass spectrometry), Chemistry, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, Secondary ion mass spectrometry, Ion beam deposition, Xenon, Angle of incidence (optics), Materials Chemistry, Thin film

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b38849c13230a5c396b32e79f17dcc5d
https://doi.org/10.1016/s0040-6090(97)00523-3

المؤلفون: Judith L. MacManus-Driscoll, N. J. Montgomery, B. Moeckly, K. Char, David S. McPhail

المصدر: Journal of Alloys and Compounds. 251:355-359

مصطلحات موضوعية: Static secondary-ion mass spectrometry, Leading edge, Materials science, Ion beam, Ion beam mixing, Mechanical Engineering, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Molecular physics, Secondary ion mass spectrometry, Ion beam deposition, Xenon, chemistry, Mechanics of Materials, Condensed Matter::Superconductivity, Materials Chemistry, Thin film

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3560f1c0588ee148b070ea0de64581d1
https://doi.org/10.1016/s0925-8388(96)02810-1

المؤلفون: B. Lakew, Shahid Aslam, B. Moeckly, H. Jones

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Superconductivity, Materials science, business.industry, Noise spectral density, Thermistor, Bolometer, Analytical chemistry, law.invention, law, Optoelectronics, Cuprate, Infrared detector, Thin film, business, Noise (radio)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a8fa5f116ca79ba9a0a3aeb8b9921ac9
https://doi.org/10.1117/12.663668

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