-
1
المؤلفون: Xinwang Liu, Tom Herrmann, G. Festes, B. Bertello, Yuri Tkachev, Boris Bayha, M. Duggan, Ralf Richter, Alban Zaka, Decobert Catherine, Thomas Melde, S. Wittek, Stefan Dunkel, N. Do, P. Ghazav, N. Bollon, F. Mauersberger, Sven Beyer, Kim Jinho, Viktor Markov, B. Muller, Zhou Feng, S. Jourba, M. Trentzsch
المصدر: 2020 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: 010302 applied physics, Computer science, business.industry, Transistor, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, law.invention, Flash (photography), Reliability (semiconductor), CMOS, Memory cell, law, 0103 physical sciences, Process integration, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Data retention, Metal gate, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::68d6b99bb8692b55d9511f87f7674fd4
https://doi.org/10.1109/imw48823.2020.9108118 -
2
المؤلفون: Jérémy Postel-Pellerin, B. Villard, R. Bouchakour, B. Bertello, F. Lalande, F. Jeuland, P. Canet
المصدر: Microelectronics Reliability. 49:1056-1059
مصطلحات موضوعية: Engineering, Specific test, business.industry, Extraction (chemistry), NAND gate, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Cell size, Flash (photography), Electronic engineering, Node (circuits), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business
-
3
المؤلفون: F. Lalande, F. Jeuland, P. Canet, Jérémy Postel-Pellerin, B. Villard, B. Bertello, R. Bouchakour
المصدر: 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS).
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, NAND gate, Hardware_PERFORMANCEANDRELIABILITY, Flash memory, International Technology Roadmap for Semiconductors, Flash (photography), Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Microelectronics, Node (circuits), Process simulation, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7631316646ce640d8fcc3eda6c0bc0b
https://doi.org/10.1109/nvmt.2009.5429787 -
4
المؤلفون: B. Bertello, R. Bouchakour, F. Lalande, F. Jeuland, Jérémy Postel-Pellerin, B. Villard, P. Canet
المصدر: 2009 International Conference on Simulation of Semiconductor Processes and Devices.
مصطلحات موضوعية: Flash (photography), Materials science, Parasitic capacitance, business.industry, Electric field, Phase (waves), Electronic engineering, NAND gate, Optoelectronics, business, Flash memory, Degradation (telecommunications), Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c3264d41fbf5fd81e1539529971afab
https://doi.org/10.1109/sispad.2009.5290208 -
5
المؤلفون: J. Postel-Pellerin, P. Canet, F. Lalande, R. Bouchakour, F. Jeuland, B. Bertello, B. Villard
المصدر: 2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS).
مصطلحات موضوعية: Flash (photography), Engineering, Hardware_MEMORYSTRUCTURES, Reliability (semiconductor), Coupling (computer programming), business.industry, Electronic engineering, NAND gate, business, Capacitance, Flash memory, Degradation (telecommunications), Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b4f04f8c45318098a2256aa82c2a5f80
https://doi.org/10.1109/nvmt.2008.4731200 -
6مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
7دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
8مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.