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المؤلفون: S. Joblot, C. De-Buttet, Sébastien Petitdidier, F. Abbate, C. Jenny, Didier Celi, B. Ramadout, Thomas Quemerais, Sebastien Haendler, Laurent Favennec, Daniel Gloria, O. Robin, C. Richard, E. Canderle, B. Borot, K. Haxaire, N. Derrier, Remi Beneyton, Julien Rosa, G. Ribes, O. Saxod, P. Brun, Y. Campidelli, Pascal Chevalier, Cedric Durand, A. Montagne, Francois Leverd, G. Imbert, Olivier Gourhant, M. Guillermet, E. Gourvest, L. Berthier, Clement Tavernier, J. Cossalter, M. Buczko, C. Deglise, Mickael Gros-Jean, C. Julien, Jean-Damien Chapon, K. Courouble, D. Ney, G. Avenier, Patrick Maury, Y. Carminati, R. Bianchini, F. Foussadier
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Bit cell, Materials science, business.industry, Heterojunction bipolar transistor, Electrical engineering, Ring oscillator, BiCMOS, Inductor, law.invention, Capacitor, CMOS, law, Extremely high frequency, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1a267063e241381b03eefae310424668
https://doi.org/10.1109/iedm.2014.7046978 -
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المؤلفون: James S. Vickers, Mario M. Pelella, G. Johnson, Nader Pakdaman, P. Gros, M. Babazadeh, J. Galvier, G. Steinbrueck, W. Doedel, M. Gatefait, B. Borot, Pascal Gouraud
المصدر: Metrology, Inspection, and Process Control for Microlithography XXIII.
مصطلحات موضوعية: Physics, Yield (engineering), business.product_category, business.industry, Bin, Computational physics, Length measurement, Volume (thermodynamics), Die (manufacturing), Process optimization, Wafer, Sensitivity (control systems), business, Telecommunications
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::42660f1b89896f741cba9b75ad7e1b22
https://doi.org/10.1117/12.823822 -
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المؤلفون: B. Borot, W. Doedel, J. Vickers, N. Pakdaman, M. Babazadeh, G. Steinbrueck, J. Galvier, J. Estabil, G. Johnson
المصدر: The 17th Annual SEMI/IEEE ASMC 2006 Conference.
مصطلحات موضوعية: Engineering, CMOS, business.industry, Electrical engineering, Electronic engineering, Wafer, Sense (electronics), business, Chip, Residual, Die (integrated circuit), Metrology, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::78eb1391d66c6789f3c6a143c88c410b
https://doi.org/10.1109/asmc.2006.1638768 -
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المؤلفون: Frederic Boeuf, M. Muller, M. Sellier, B. Borot, F. Payet, Thomas Skotnicki, A. Pouydebasque, Emmanuel Josse, B. Duriez
المصدر: Extended Abstracts of the 2006 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, Generator (computer programming), business.industry, Spice, Electrical engineering, Technology assessment, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bbf2e7bc3d3da66ea2adbb5cefeb6fef
https://doi.org/10.7567/ssdm.2006.h-7-4 -
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المؤلفون: N. Bicais-Lepinay, V. DeJonghe, B. Tavel, M. Jurdit, Stephane Denorme, C. Boccaccio, F. Andre, M. Aminpur, S. Manakli, M. Broekaart, J. Todeschini, C. Laviron, S. Smith, B. Icard, C. Reddy, B. Borot, Nicolas Planes, S. Jullian, Thomas Skotnicki, F. Guyader, Frederic Boeuf, J.P. Jacquemin, P. Morini, J. Bustos, N. Gierczynski, Pascal Gouraud, P. Brun, Franck Arnaud, M. Mellier, F. Salvetti, C. Ortolland, B. Duriez, Laurent Pain
المصدر: Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
مصطلحات موضوعية: Physics, Electron mobility, business.industry, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, PMOS logic, CMOS, Gate oxide, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Static random-access memory, business, Lithography, Electron-beam lithography, NMOS logic, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cd5d5402c851ccecf8dcda10c729bbfe
https://doi.org/10.1109/.2005.1469240 -
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المؤلفون: J.M. Portal, L. Forli, B. Borot, D. Nee
المصدر: Proceedings of the Fifth IEEE International Caracas Conference on Devices, Circuits and Systems, 2004..
مصطلحات موضوعية: Engineering, Integrated circuit development, business.industry, Emphasis (telecommunications), Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Technology development, Chip, Signature (logic), Test (assessment), Embedded system, Scalability, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::67886de03916e782d007be3266ed63ca
https://doi.org/10.1109/iccdcs.2004.1393357 -
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المؤلفون: B. Borot, L. Forli, D. Nec, J.M. Portal
المصدر: ITC
مصطلحات موضوعية: Engineering, business.industry, Yield (finance), Scalability, business, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::077630149dc91de75599379941de269e
https://doi.org/10.1109/test.2003.1271101 -
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المؤلفون: J. Cluzel, B. Borot, J.-P. Schoellkopf, E. Guichard, B. Froment, S. Hanriat, H. Jaouen
المصدر: Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247).
مصطلحات موضوعية: Interconnection, Materials science, CMOS, Parasitic capacitance, Capacitive sensing, Hardware_INTEGRATEDCIRCUITS, Calibration, Electronic engineering, Low-k dielectric, Hardware_PERFORMANCEANDRELIABILITY, Dielectric, Capacitance
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::da4e9234e648382943f4e0c4c6e13ff3
https://doi.org/10.1109/iitc.1999.787128 -
9مؤتمر
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تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
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تسجيل الدخول للوصول الكامل.