المؤلفون: Basu, C., Banerjee, K., Ghosh, T. K., Mukherjee, G., Bhattacharya, C., Desai, Shraddha S, Shil, R., Saha, A. K., Meena, J. K., Bar, T., Basak, D., Sahoo, L. K., Saha, S., Marick, C., Das, D., Kujur, M., Roy, S., Basu, S. S., Gond, U., Saha, A., Das, A., Samanta, M., Saha, P., Karan, S. K.

مصطلحات موضوعية: Physics - Instrumentation and Detectors, Nuclear Experiment, Physics - Accelerator Physics

URL الوصول: http://arxiv.org/abs/2402.03344

المؤلفون: Kaczmarek, K., Bardon, M.G., Xiang, Y., Ronchi, N., Ragnarsson, L., Celano, U., Banerjee, K., Kaczer, B., Groeseneken, G., Van Houdt, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(7):3928-3934 Jul, 2023

المؤلفون: Rana, T. K., Pandit, Deepak, Manna, S., Kundu, S., Banerjee, K., Sen, A., Pandey, R., Mukherjee, G., Ghosh, T. K., Nayak, S. S., Shil, R., Karmakar, P., Atreya, K., Rani, K., Paul, D., Santra, Rajkumar, Sultana, A., Basu, S., Pal, S., Sadhukhan, S., Mondal, Debasish, Mukhopadhyay, S., Bhattacharya, Srijit, Pal, Surajit, Pant, Pankaj, Roy, Pratap, Ali, Sk M., Mondal, S., De, A., Dey, Balaram, Datta, R., Bhattacharya, S., Bhattacharya, C.

مصطلحات موضوعية: Nuclear Experiment

URL الوصول: http://arxiv.org/abs/2311.08781

المؤلفون: Lee, S., Ronchi, N., Bizindavyi, J., Popovici, M.I., Banerjee, K., Walke, A., Delhougne, R., Van Houdt, J., Shin, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(5):2568-2574 May, 2023

المؤلفون: Kumar, V.^{Aff1, Aff2}, Das, M.^{Aff1, Aff2, IDs4160502300433w_cor2}, Ali, S., Biswas, N., Shil, R., Banerjee, K., Pallav, P., Nandy, M.

المصدر: Radiation Detection Technology and Methods. 8(2):1202-1207

المؤلفون: Banerjee K, Pramanik S, Mondal LK

المصدر: Clinical Ophthalmology, Vol Volume 18, Pp 1901-1908 (2024)

مصطلحات موضوعية: best eye, worst eye, unordered pairs, Ophthalmology, RE1-994

وصف الملف: electronic resource

Relation: https://www.dovepress.com/statistical-methods-for-best-and-worst-eye-measurements-peer-reviewed-fulltext-article-OPTH; https://doaj.org/toc/1177-5483

URL الوصول: https://doaj.org/article/0c22238c797746669b773862049682af

المؤلفون: Rachidi, S., Arreghini, A., Verreck, D., Donadio, G. L., Banerjee, K., Katcko, K., Oniki, Y., Van den bosch, G., Rosmeulen, M.

المصدر: 2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022

Relation: 2022 IEEE International Memory Workshop (IMW)

المؤلفون: Ronchi, N., Ragnarsson, L. -A., Celano, U., Kaczer, B., Kaczmarek, K., Banerjee, K., McMitchell, S. R. C., Van den bosch, G., Van Houdt, J.

المصدر: 2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022

Relation: 2022 IEEE International Memory Workshop (IMW)

المؤلفون: Breuil, L., Nyns, L., Rachidi, S., Banerjee, K., Arreghini, A., Bastos, J., Ramesh, S., Van den bosch, G., Rosmeulen, M.

المصدر: 2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022

Relation: 2022 IEEE International Memory Workshop (IMW)

المؤلفون: Ramesh, S., Banerjee, K., Opsomer, K., Rachita, I., Bastos, J.P., Soulie, J., Sebaai, F., Favia, P., Korytov, M., Richard, O., Breuil, L., Arreghini, A., Van Den Bosch, G., Rosmeulen, M.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(12):2085-2088 Dec, 2022