المؤلفون: Panagiota, Papavramidou, Ricavy, Sebastien, Mounet, Christopher, Jahan, Carine, Castellani, Niccolo, Andrieu, Francois

المصدر: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-7 Jul, 2024

Relation: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)

المؤلفون: Romain, Luc, Nordmann, Paul-Patrick, Nadeau-Dostie, Benoit, Schramm, Lori, Keim, Martin

المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

المؤلفون: Banerjee, Sabyasachee, Majumder, Subhashis, Bhattacharya, Bhargab B.

المصدر: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID), 2024 37th International Conference on. :684-689 Jan, 2024

Relation: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)

المؤلفون: Karkare, Nikhil, Pradeep, Wilson

المصدر: 2023 IEEE International Test Conference India (ITC India) Test Conference India (ITC India), 2023 IEEE International. :1-6 Jul, 2023

Relation: 2023 IEEE International Test Conference India (ITC India)

المؤلفون: Lee, H., Kim, J., Park, J., Kang, S.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(9):3092-3104 Sep, 2023

المؤلفون: Lee, H., Shin, S.H., Yoo, Y., Kang, S.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(7):2377-2390 Jul, 2023

المؤلفون: Lu, Shyue-Kung, Tseng, Shi-Chun, Miyase, Kohei

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :391-399 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Zou, Wei, Nadeau-Dostie, Benoit

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :56-62 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Supriya Reddy, LuckyReddy Hema, Muchahary, Deboraj, Singh Raghuvanshi, Ajay

المصدر: 2022 2nd International Conference on Intelligent Technologies (CONIT) Intelligent Technologies (CONIT), 2022 2nd International Conference on. :1-5 Jun, 2022

Relation: 2022 International Conference on Intelligent Technologies (CONIT)

المؤلفون: Tan, Pai-Yu, Tung, Chih-Hsuan, Wu, Cheng-Wen, Lee, Mincent, Liao, Gordon

المصدر: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2022 International Symposium on. :1-4 Apr, 2022

Relation: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)