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1مؤتمر
المؤلفون: Panagiota, Papavramidou, Ricavy, Sebastien, Mounet, Christopher, Jahan, Carine, Castellani, Niccolo, Andrieu, Francois
المصدر: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-7 Jul, 2024
Relation: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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2مؤتمر
المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024
Relation: 2024 IEEE European Test Symposium (ETS)
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3مؤتمر
المصدر: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID), 2024 37th International Conference on. :684-689 Jan, 2024
Relation: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)
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4مؤتمر
المؤلفون: Karkare, Nikhil, Pradeep, Wilson
المصدر: 2023 IEEE International Test Conference India (ITC India) Test Conference India (ITC India), 2023 IEEE International. :1-6 Jul, 2023
Relation: 2023 IEEE International Test Conference India (ITC India)
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5دورية أكاديمية
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(9):3092-3104 Sep, 2023
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6دورية أكاديمية
المؤلفون: Lee, H., Shin, S.H., Yoo, Y., Kang, S.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(7):2377-2390 Jul, 2023
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7مؤتمر
المؤلفون: Lu, Shyue-Kung, Tseng, Shi-Chun, Miyase, Kohei
المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :391-399 Sep, 2022
Relation: 2022 IEEE International Test Conference (ITC)
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8مؤتمر
المؤلفون: Zou, Wei, Nadeau-Dostie, Benoit
المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :56-62 Sep, 2022
Relation: 2022 IEEE International Test Conference (ITC)
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9مؤتمر
المصدر: 2022 2nd International Conference on Intelligent Technologies (CONIT) Intelligent Technologies (CONIT), 2022 2nd International Conference on. :1-5 Jun, 2022
Relation: 2022 International Conference on Intelligent Technologies (CONIT)
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10مؤتمر
المؤلفون: Tan, Pai-Yu, Tung, Chih-Hsuan, Wu, Cheng-Wen, Lee, Mincent, Liao, Gordon
المصدر: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2022 International Symposium on. :1-4 Apr, 2022
Relation: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)