المؤلفون: Bartels, M., Decker, S., Neinhus, B., Bach, K.H., Schuppen, A., Meinerzhagen, B.

المصدر: Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.99CH37024) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 1999. Proceedings of the 1999. :105-108 1999

Relation: Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting

المؤلفون: Meinerzhagen, B., Bach, K.H., Bork, I., Eng, W.L.

المصدر: NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on. :91-96 1992

Relation: Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits,

المؤلفون: Liebmann, R., Nawaz, M., Bach, K.H.

المصدر: 2006 International Conference on Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2006 International Conference on. :173-175 Sep, 2006

Relation: 2006 International Conference on Simulation of Semiconductor Processes and Devices

المؤلفون: Bach, K.H., Dirks, H.K., Meinerzhagen, B., Engl, W.L.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 10(9):1175-1186 Sep, 1991

المؤلفون: Jabs, D., Jungemann, C., Bach, K.H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 62(8):2614-2619 Aug, 2015

المؤلفون: Bach, K.H., Dirks, H.K., Meinerzhagen, B., Engl, W.L.

المصدر: Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on. :33-34 1990

Relation: Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits

المؤلفون: Giles, L.F., Colombeau, B., Cowern, N., Molzer, W., Schaefer, H., Bach, K.H., Haibach, P., Roozeboom, F.

المصدر: In Solid State Electronics 2005 49(4):618-627

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