المؤلفون: Bahl, Swapnil, Rungta, Shreyans, Khullar, Shray, Kapur, Rohit, Chandra, Anshuman, Talluto, Salvatore, Notiyath, Pramod, Rajagopalan, Ajay

المصدر: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on. :191-196 Oct, 2014

Relation: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Marinissen, Erik Jan, Vandling, Gilbert, Goel, Sandeep Kumar, Hapke, Friedrich, Rivers, Jason, Mittermaier, Nikolaus, Bahl, Swapnil

المصدر: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012. :123-128 Mar, 2012

Relation: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)

المؤلفون: Khullar, Shray, Bahl, Swapnil

المصدر: 2011 Asian Test Symposium Test Symposium (ATS), 2011 20th Asian. :500-505 Nov, 2011

Relation: 2011 IEEE 20th Asian Test Symposium (ATS)

المؤلفون: Bahl, Swapnil, Mattiuzzo, R., Khullar, Shray, Garg, Akhil, Graniello, S., Abdel-Hafez, Khader S., Talluto, Salvatore

المصدر: 2011 IEEE International Test Conference Test Conference (ITC), 2011 IEEE International. :1-10 Sep, 2011

Relation: 2011 IEEE International Test Conference (ITC)

المؤلفون: Bahl, Swapnil, Sarkar, Rajiv, Garg, Akhil

المصدر: 2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-1 Oct, 2008

Relation: 2008 IEEE International Test Conference (ITC)

المؤلفون: Bahl, Swapnil, Srivastava, Vishal

المصدر: 2008 13th European Test Symposium Test Symposium, 2008 13th European. :91-96 May, 2008

Relation: 2008 13th IEEE European Test Symposium (ETS)

المؤلفون: Bahl, Swapnil

المصدر: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on. :331-339 Sep, 2007

Relation: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems