المؤلفون: Biscarrat, J., Gwoziecki, R., Baines, Y., Buckley, J., Gillot, C., Vandendaele, W., Garnier, G., Charles, M., Plissonnier, M.

المصدر: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2018 IEEE 30th International Symposium on. :200-203 May, 2018

Relation: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Vandendaele, W., Lorin, T., Gwoziecki, R., Baines, Y., Biscarrat, J., Jaud, M.A., Gillot, C., Charles, M., Plissonnier, M., Reimbold, G.

المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :126-129 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Jaud, M.-A., Baines, Y., Charles, M., Morvan, E., Scheiblin, P., Torres, A., Plissonnier, M., Barbe, J.-C.

المصدر: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2017 International Conference on. :113-116 Sep, 2017

Relation: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

المؤلفون: Lehmann, J., Leroux, C., Reimbold, G., Charles, M., Torres, A., Morvan, E., Baines, Y., Ghibaudo, G., Bano, E.

المصدر: Proceedings of the 2015 International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2015 International Conference on. :163-168 Mar, 2015

Relation: 2015 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Lorin, T., Vandendaele, W., Gwoziecki, R., Baines, Y., Biscarrat, J., Jaud, M., Gillot, C., Charles, M., Plissonnier, M., Ghibaudo, G., Gaillard, F.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 6:956-964 2018

المؤلفون: Di Cioccio, L., Morvan, E., Charles, M., Perichon, P., Torres, A., Ayel, F., Bergogne, D., Baines, Y., Fayolle, M., Escoffier, R., Vandendaele, W., Barranger, D., Garnier, G., Mendizabal, L., Thollin, B., Plissonnier, M.

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2015 IEEE International. :16.5.1-16.5.4 Dec, 2015

Relation: 2015 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Niimi, Y., Baines, Y., Capron, T., Mailly, D., Lo, F. -Y., Wieck, A. D., Meunier, T., Saminadayar, L., Bauerle, C.

المصدر: Phys. Rev. Lett. 102, 226801 (2009)

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/0809.1381

المؤلفون: Capron, T., Niimi, Y., Baines, Y., Mailly, D., Lo, F. -Y., Melnikov, A., Wieck, A. D., Saminadayar, L., Bäuerle, C.

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/0711.1810

المؤلفون: Charles, M., Baines, Y., Bavard, A., Bouveyron, R.

المصدر: In Journal of Crystal Growth 1 February 2018 483:89-93

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