يعرض 1 - 10 نتائج من 32 نتيجة بحث عن '"Balasubramanian, Lakshmanan"', وقت الاستعلام: 0.97s تنقيح النتائج
  1. 1
    مؤتمر
    Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling

    المؤلفون: Aksoy, Tolga, Modala, Nikhil Sagar, Balasubramanian, Lakshmanan, Parekhji, Rubin, Ozev, Sule

    المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

    Relation: 2024 IEEE European Test Symposium (ETS)

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  2. 2
    مؤتمر
    Machine Learning based Waveform Predictions using Discrete Wavelet Transform for Automated Verification of Analog and Mixed Signal Integrated Circuits

    المؤلفون: Devi, J Dhurga, Srinivasan, Bama, Ravindran, Selvi, Parthasarathi, Ranjani, Ramakrishna, Pv, Balasubramanian, Lakshmanan

    المصدر: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID), 2024 37th International Conference on. :61-66 Jan, 2024

    Relation: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)

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  3. 3
    مؤتمر
    Unified Analog Mixed-Signal Defect Simulation and Applications

    المؤلفون: Ganapathy Raman, Krishna Kumar, R, Aswin, Qureshi, Arshad, R, Supraja, V, Chanakya K, Sankaran, Vijay Kumar, Rawat, Vinay, Zhuk, Victor, Balasubramanian, Lakshmanan

    المصدر: 2023 IEEE International Test Conference India (ITC India) Test Conference India (ITC India), 2023 IEEE International. :1-6 Jul, 2023

    Relation: 2023 IEEE International Test Conference India (ITC India)

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  4. 4
    مؤتمر
    Analysis of Machine Learning Techniques for Time Domain Waveform Prediction in Analog and Mixed Signal Integrated Circuit Verification

    المؤلفون: V, Dhanasekar, Gunasekaran, Vinodhini, Challa, Anusha, Srinivasan, Bama, Devi, J Dhurga, Ravindran, Selvi, Parthasarathi, Ranjani, Ramakrishna, P V, Geetha Kumar, Gopika, Padmanabhan, Venkateswaran, Lakshmanan, Guha, Balasubramanian, Lakshmanan

    المصدر: 2023 24th International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2023 24th International Symposium on. :1-9 Apr, 2023

    Relation: 2023 24th International Symposium on Quality Electronic Design (ISQED)

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  5. 5
    مؤتمر
    Analog Coverage-driven Selection of Simulation Corners for AMS Integrated Circuits

    المؤلفون: Sanyal, Sayandeep, Hazra, Aritra, Dasgupta, Pallab, Morrison, Scott, Surendran, Sudhakar, Balasubramanian, Lakshmanan, Rahman, Mohammad Moshiur

    المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023

    Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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  6. 6
    مؤتمر
    Tracking Coverage Artefacts for Periodic Signals using Sequence-based Abstractions

    المؤلفون: Chakraborty, Ayan, Sanyal, Sayandeep, Dasgupta, Pallab, Hazra, Aritra, Morrison, Scott, Surendran, Sudhakar, Balasubramanian, Lakshmanan

    المصدر: 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID), 2022 35th International Conference on. :132-137 Feb, 2022

    Relation: 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)

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  7. 7
    مؤتمر
    CoveRT: A Coverage Reporting Tool for Analog Mixed-Signal Designs

    المؤلفون: Sanyal, Sayandeep, Hazra, Aritra, Dasgupta, Pallab, Morrison, Scott, Surendran, Sudhakar, Balasubramanian, Lakshmanan

    المصدر: 2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID) VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID), 2020 33rd International Conference on. :119-124 Jan, 2020

    Relation: 2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID)

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  8. 8
    مؤتمر
    The Notion of Cross Coverage in AMS Design Verification

    المؤلفون: Sanyal, Sayandeep, Hazra, Aritra, Dasgupta, Pallab, Morrison, Scott, Surendran, Sudhakar, Balasubramanian, Lakshmanan

    المصدر: 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2020 25th Asia and South Pacific. :217-222 Jan, 2020

    Relation: 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)

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  9. 9
    مؤتمر
    On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC

    المؤلفون: Erol, Osman Emir, Ozev, Sule, Suresh, Chandra, Parekhji, Rubin, Balasubramanian, Lakshmanan

    المصدر: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015. :1559-1562 Mar, 2015

    Relation: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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  10. 10
    مؤتمر
    New Methods for Simulation Speed-up and Test Qualification with Analog Fault Simulation

    المؤلفون: Devanathan, V.R., Balasubramanian, Lakshmanan, Parekhji, Rubin

    المصدر: 2015 28th International Conference on VLSI Design VLSI Design (VLSID), 2015 28th International Conference on. :363-368 Jan, 2015

    Relation: 2015 28th International Conference on VLSI Design (VLSID)

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