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1تقرير
المؤلفون: Lu, Haotian, Banerjee, Sanmitra, Gu, Jiaqi
مصطلحات موضوعية: Computer Science - Emerging Technologies, Computer Science - Artificial Intelligence, Computer Science - Machine Learning
URL الوصول: http://arxiv.org/abs/2403.02688
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2مؤتمر
المصدر: 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-4 Apr, 2023
Relation: 2023 IEEE 41st VLSI Test Symposium (VTS)
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3تقرير
المؤلفون: Liu, Mingjie, Ene, Teodor-Dumitru, Kirby, Robert, Cheng, Chris, Pinckney, Nathaniel, Liang, Rongjian, Alben, Jonah, Anand, Himyanshu, Banerjee, Sanmitra, Bayraktaroglu, Ismet, Bhaskaran, Bonita, Catanzaro, Bryan, Chaudhuri, Arjun, Clay, Sharon, Dally, Bill, Dang, Laura, Deshpande, Parikshit, Dhodhi, Siddhanth, Halepete, Sameer, Hill, Eric, Hu, Jiashang, Jain, Sumit, Jindal, Ankit, Khailany, Brucek, Kokai, George, Kunal, Kishor, Li, Xiaowei, Lind, Charley, Liu, Hao, Oberman, Stuart, Omar, Sujeet, Pasandi, Ghasem, Pratty, Sreedhar, Raiman, Jonathan, Sarkar, Ambar, Shao, Zhengjiang, Sun, Hanfei, Suthar, Pratik P, Tej, Varun, Turner, Walker, Xu, Kaizhe, Ren, Haoxing
مصطلحات موضوعية: Computer Science - Computation and Language
URL الوصول: http://arxiv.org/abs/2311.00176
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4تقرير
مصطلحات موضوعية: Computer Science - Emerging Technologies, Physics - Applied Physics
URL الوصول: http://arxiv.org/abs/2309.06579
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5تقرير
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6مؤتمر
المؤلفون: Bhaskaran, Bonita, Banerjee, Sanmitra, Narayanun, Kaushik, Hung, Shao-Chun, Mozaffari Mojaveri, Seyed Nima, Liu, Mengyun, Chen, Gang, Liang, Tung-Che
المصدر: 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD) Computer Aided Design (ICCAD)2022 IEEE/ACM International Conference On. :1-8 Oct, 2022
Relation: 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
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7مؤتمر
المصدر: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-6 Sep, 2022
Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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8مؤتمر
المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :118-127 Sep, 2022
Relation: 2022 IEEE International Test Conference (ITC)
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9مؤتمر
المصدر: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ISVLSI VLSI (ISVLSI), 2022 IEEE Computer Society Annual Symposium on. :128-133 Jul, 2022
Relation: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
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10مؤتمر
المصدر: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :448-453 Mar, 2022
Relation: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)