المؤلفون: Lee, E.H., Keh, Y.C., Kang, J.K., Bang, Y.C., Kim, Y.H., Hwang, S.L., Shin, D.J., Park, S.S., Lee, J.S., Lee, J.K., Oh, Y.K., Jang, D.H.

المصدر: International Conference on Indium Phosphide and Related Materials, 2005 Indium Phosphate and Related Materials Indium Phosphide and Related Materials, 2005. International Conference on. :621-624 2005

Relation: 2005 International Conference on Indium Phosphate And Related Materials

المؤلفون: Bang, Y.C., Kim, H.S., Kim, J.-Y., Lee, E.H., Lee, J.K., Kim, T.I.

المصدر: 16th IPRM. 2004 International Conference on Indium Phosphide and Related Materials, 2004. Indium Phosphide and Related Materials Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on. :142-145 2004

Relation: 2004 International Conference on Indium Phosphide and Related Materials. 16th IPRM

المؤلفون: Lee, J.K., Lee, E.H., Shin, D.J., Bang, Y.C., Kim, J.Y., Lee, J.H., Kim, H.S., Oh, Y.K., Kim, T.

المصدر: 16th IPRM. 2004 International Conference on Indium Phosphide and Related Materials, 2004. Indium Phosphide and Related Materials Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on. :746-749 2004

Relation: 2004 International Conference on Indium Phosphide and Related Materials. 16th IPRM

المؤلفون: Lee, E.H., Bang, Y.C., Kang, J.K., Keh, Y.C., Shin, D.J., Lee, J.S., Park, S.S., Kim, I., Lee, J.K., Oh, Y.K., Jang, D.H.

المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 18(5):667-669 Mar, 2006

المؤلفون: Bang, Y.C, Radhakrishnan, S ^*, Rao, N.S.V, Batsell, S.G

المصدر: In Computer Communications 2000 23(11):1064-1068

المؤلفون: Lee, J.K., Lee, E.H., Shin, D.J., Bang, Y.C., Kim, J.Y., Lee, J.H., Kim, H.S., Oh, Y.K., Kim, T.

المصدر: 16th IPRM. 2004 International Conference on Indium Phosphide & Related Materials, 2004; 2004, p746-749, 4p

المؤلفون: Shin, D.J., Jung, D.K., Lee, J.K., Lee, J.H., Choi, Y.H., Bang, Y.C., Shin, H.S., Lee, J., Hwang, S.T., Oh, Y.J.

المصدر: Electronics Letters (Institution of Engineering & Technology); 9/4/2003, Vol. 39 Issue 18, p1331-1332, 2p

مصطلحات موضوعية: FABRY-Perot interferometers, RELIABILITY in engineering, WAVELENGTH division multiplexing, OPTICAL communications

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