يعرض 1 - 10 نتائج من 578 نتيجة بحث عن '"Bansal, Nidhi"', وقت الاستعلام: 1.57s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2024 IEEE International Conference on Computing, Power and Communication Technologies (IC2PCT) Computing, Power and Communication Technologies (IC2PCT), 2024 IEEE International Conference on. 5:683-689 Feb, 2024

    Relation: 2024 IEEE International Conference on Computing, Power and Communication Technologies (IC2PCT)

  2. 2
    مؤتمر

    المصدر: 2023 3rd International Conference on Advancement in Electronics & Communication Engineering (AECE) Advancement in Electronics & Communication Engineering (AECE), 2023 3rd International Conference on. :589-593 Nov, 2023

    Relation: 2023 3rd International Conference on Advancement in Electronics & Communication Engineering (AECE)

  3. 3
    مؤتمر

    المصدر: 2023 International Conference on Disruptive Technologies (ICDT) Disruptive Technologies (ICDT), 2023 International Conference on. :424-427 May, 2023

    Relation: 2023 International Conference on Disruptive Technologies (ICDT)

  4. 4
    مؤتمر

    المصدر: 2023 7th International Conference on Trends in Electronics and Informatics (ICOEI) Trends in Electronics and Informatics (ICOEI), 2023 7th International Conference on. :704-708 Apr, 2023

    Relation: 2023 7th International Conference on Trends in Electronics and Informatics (ICOEI)

  5. 5
    دورية أكاديمية

    المؤلفون: Ho, Thao M.Aff1, Aff2, Aff3, Xiong, XiaoyingAff2, Aff3, Bhandari, Bhesh R.Aff2, Aff3, Bansal, NidhiAff2, Aff3, IDs1194702403407y_cor4

    المصدر: Food and Bioprocess Technology: An International Journal. :1-14

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  7. 7
  8. 8
    مؤتمر

    المصدر: 2021 5th International Conference on Trends in Electronics and Informatics (ICOEI) Trends in Electronics and Informatics (ICOEI), 2021 5th International Conference on. :435-439 Jun, 2021

    Relation: 2021 5th International Conference on Trends in Electronics and Informatics (ICOEI)

  9. 9
    دورية أكاديمية

    المؤلفون: Bansal, NidhiAff1, IDs1319802302068y_cor1, Singh, Ajay Kumar

    المصدر: International Journal of System Assurance Engineering and Management. 14(6):2267-2275

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