المؤلفون: van der Veen, Marleen H., Barbarin, Yohan, Kashiwagi, Yusaku, Tokei, Zsolt

المصدر: IEEE International Interconnect Technology Conference Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International. :181-184 May, 2014

Relation: 2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC)

المؤلفون: Croes, Kristof, Cherman, Vladimir O., Li, Yunlong, Zhao, Larry, Barbarin, Yohan, De Messemaeker, Joke, Civale, Yann, Velenis, Dimitrios, Stucchi, Michele, Kauerauf, Thomas, Redolfi, Augusto, Dimcic, Biljana, Ivankovic, Andrej, Van der Plas, Geert, De Wolf, Ingrid, Beyer, Gerald, Swinnen, Bart, Tokei, Zsolt, Beyne, Eric

المصدر: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-5 Jul, 2012

Relation: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)

المؤلفون: Lieberman, Robert A., Sanders, Glen A., Buric, Michael P., Maqueda, Sébastien, Perchoux, Julien, Tronche, Clément, Thamié, Louis, Dufourmentel, Alan, Genetier, Marc, Lavayssière, Maylis, Barbarin, Yohan

المصدر: Proceedings of SPIE; June 2024, Vol. 13044 Issue: 1 p130440B-130440B-8, 1173969p

المؤلفون: Van Besien, Els, Wang, Cong, Verdonck, Patrick, Singh, Arjun, Barbarin, Yohan, de Marneffe, Jean-Francois, Vanstreels, Kris, Tielens, Hilde, Schaekers, Marc, Baklanov, Mikhail R., Van Elshocht, Sven

المصدر: 2013 IEEE International Interconnect Technology Conference - IITC Interconnect Technology Conference (IITC), 2013 IEEE International. :1-3 Jun, 2013

Relation: 2013 IEEE International Interconnect Technology Conference - IITC

المؤلفون: van der Veen, Marleen H., Barbarin, Yohan, Vereecke, Bart, Sugiura, Masahito, Kashiwagi, Yusaku, Cott, Daire J., Huyghebaert, Cedric, Tokei, Zsolt

المصدر: 2013 IEEE International Interconnect Technology Conference - IITC Interconnect Technology Conference (IITC), 2013 IEEE International. :1-3 Jun, 2013

Relation: 2013 IEEE International Interconnect Technology Conference - IITC

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المؤلفون: Li, Yunlong, Wu, Chen, Degraeve, Robin, Croes, Kristof, Barbarin, Yohan, Baklanov, Mikhail R., Tokei, Zsolt

المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :BD.4.1-BD.4.4 Apr, 2013

Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)

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المؤلفون: Xie, Jingquan^Aff16, Theocharidou, Marianthi^Aff17, Barbarin, Yohan^Aff18

المساهمون: Hutchison, David, Series editor^Aff1, Kanade, Takeo, Series editor^Aff2, Kittler, Josef, Series editor^Aff3, Kleinberg, Jon M., Series editor^Aff4, Mattern, Friedemann, Series editor^Aff5, Mitchell, John C., Series editor^Aff6, Naor, Moni, Series editor^Aff7, Pandu Rangan, C., Series editor^Aff8, Steffen, Bernhard, Series editor^Aff9, Terzopoulos, Demetri, Series editor^Aff10, Tygar, Doug, Series editor^Aff11, Weikum, Gerhard, Series editor^Aff12, Rome, Erich, editor^Aff13, Theocharidou, Marianthi, editor^Aff14, Wolthusen, Stephen, editor^Aff15

المصدر: Critical Information Infrastructures Security : 10th International Conference, CRITIS 2015, Berlin, Germany, October 5-7, 2015, Revised Selected Papers. 9578:91-102