-
1
المؤلفون: Ernest Wu, Ron Bolam, Baozhen Li, Tian Shen, Barry Linder, Griselda Bonilla, Miaomiao Wang, Dechao Guo
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::433de42a91436ab4474c96f0a157afb7
https://doi.org/10.1109/irps48227.2022.9764541 -
2
المؤلفون: Barry Linder
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Serviceability (computer), Enterprise system, Computer science, Server, Fault tolerance, IBM, Fault (power engineering), Supercomputer, Reliability (statistics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9bbb51d9c5d9664d7e878fe0e9fad085
https://doi.org/10.1117/12.2586690 -
3
المؤلفون: Kim Andrew Tae, Baozhen Li, Barry Linder, Ernest Y. Wu
المصدر: IRPS
مصطلحات موضوعية: Physics, Mathematical analysis, Constant voltage, Time-dependent gate oxide breakdown, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dec06a67061f5ccf2c7da4090cf2ccb7
https://doi.org/10.1109/irps.2019.8720572 -
4
المؤلفون: Richard G. Southwick, Hemanth Jagannathan, Huimei Zhou, Barry Linder, Ruqiang Bao, T. Ando, Dechao Guo, Vijay Narayanan, Lee Choonghyun
المصدر: 2018 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Silicon-germanium, chemistry.chemical_compound, chemistry, Logic gate, 0103 physical sciences, Optoelectronics, Breakdown voltage, Work function, 0210 nano-technology, business, Metal gate, AND gate, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e28dfa9f551ce5e8c457f6862dee6ac9
https://doi.org/10.1109/vlsit.2018.8510650 -
5
المؤلفون: Keith A. Jenkins, Alan J. Weger, Peilin Song, Barry Linder, Franco Stellari, Giuseppe La Rosa
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Transistor channel, Materials science, business.industry, 020208 electrical & electronic engineering, Near-infrared spectroscopy, Transistor, Time constant, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Thermal management of electronic devices and systems, 01 natural sciences, law.invention, Computer Science::Hardware Architecture, CMOS, law, Temporal resolution, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, business, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e6c4960c692a690d1e26af0ed6db0385
https://doi.org/10.1109/irps.2018.8353625 -
6
المؤلفون: Andrew Kim, P. McLaughlin, Barry Linder, Cathryn Christiansen, Baozhen Li
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Interconnection, Computer science, InformationSystems_INFORMATIONSYSTEMSAPPLICATIONS, ComputerApplications_COMPUTERSINOTHERSYSTEMS, Product lifetime, 01 natural sciences, Electromigration, 0103 physical sciences, Redundancy (engineering), Electronic engineering, Power grid, Power network design, Voltage drop
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4729183cc4d094ddd859dc9ae9c10e95
https://doi.org/10.1109/irps.2018.8353599 -
7
المؤلفون: Baozhen Li, Barry Linder, Andrew Kim
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Back end of line, Materials science, Thermal conductivity, Stack (abstract data type), Circuit design, 0103 physical sciences, Transient (oscillation), Mechanics, 01 natural sciences, Electromigration, Finite element method, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b9bba0db0080f70064c8f15feb5b42d8
https://doi.org/10.1109/irps.2018.8353672 -
8
المصدر: Micro-and Nanoelectronics
مصطلحات موضوعية: Planar, Computer science, Reliability (statistics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7274d8941d7abba5c2762f3397a64dd4
https://doi.org/10.1201/b17597-7 -
9
المؤلفون: R. Bolam, Barry Linder, Andrew Kim, Baozhen Li, Ernest Y. Wu
المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: Process variation, Stress (mechanics), Materials science, Skewness, Semiconductor device modeling, Electronic engineering, Time-dependent gate oxide breakdown, Wafer, Biological system, Scaling, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d0e240ef796cb14a6625bf1d8b9a92e0
https://doi.org/10.1109/irps.2017.7936326 -
10
المؤلفون: Siddarth A. Krishnan, Eduard A. Cartier, Barry Linder
المصدر: ECS Transactions. 53:187-192
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Electrical engineering, Gate stack, Dielectric, business, Metal gate, Engineering physics