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1دورية أكاديميةIntranasal delivery of shRNA to knockdown the 5HT-2A receptor enhances memory and alleviates anxiety
المؤلفون: Troy T. Rohn, Dean Radin, Tracy Brandmeyer, Peter G. Seidler, Barry J. Linder, Tom Lytle, John L. Mee, Fabio Macciardi
المصدر: Translational Psychiatry, Vol 14, Iss 1, Pp 1-14 (2024)
مصطلحات موضوعية: Neurosciences. Biological psychiatry. Neuropsychiatry, RC321-571
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2158-3188
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2
المؤلفون: Barry P. Linder, Giuseppe La Rosa, Elnatan Mataev, James H. Stathis
المصدر: IRPS
مصطلحات موضوعية: Stress (mechanics), Materials science, Reliability (semiconductor), Negative-bias temperature instability, CMOS, Condensed matter physics, Relaxation (physics), Term (time), Degradation (telecommunications), Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::47c4925758a8390e96068362bde8d1a2
https://doi.org/10.1109/irps.2019.8720442 -
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المؤلفون: Keith A. Jenkins, Herschel A. Ainspan, Chih-Hsiang Ho, Barry P. Linder, Ray Emily A, Peilin Song
المصدر: IEEE Transactions on Electron Devices. 62:2148-2154
مصطلحات موضوعية: Negative-bias temperature instability, Materials science, business.industry, Transistor, Accelerated aging, Electronic, Optical and Magnetic Materials, law.invention, Voltage-controlled oscillator, Reliability (semiconductor), law, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Hot-carrier injection, Voltage, Degradation (telecommunications)
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4
المؤلفون: Keith A. Jenkins, Barry P. Linder
المصدر: IEEE Electron Device Letters. 36:1274-1276
مصطلحات موضوعية: Materials science, business.industry, Pulse (signal processing), Transistor, Electrical engineering, Silicon on insulator, Nanosecond, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), law, Optoelectronics, Degradation (geology), Field-effect transistor, Electrical and Electronic Engineering, business, Hot-carrier injection
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5
المؤلفون: Miaomiao Wang, Xin Miao, James H. Stathis, Derrick Liu, Koji Watanabe, Barry P. Linder, Richard G. Southwick, Ruqiang Bao
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Materials science, Silicon, business.industry, Electrical engineering, chemistry.chemical_element, Dielectric, Silicon-germanium, Stress (mechanics), chemistry.chemical_compound, chemistry, Logic gate, Optoelectronics, Degradation (geology), business, Metal gate, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::71e98a1c17064acf52373b3d8face0c4
https://doi.org/10.1109/iedm.2016.7838423 -
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المؤلفون: Richard G. Southwick, Mohit Bajaj, Eduard A. Cartier, A. Dasgupta, Takashi Ando, Oleg Gluschenkov, Unoh Kwon, Vijay Narayanan, Jinping Liu, Marinus Hopstaken, W.L. Chang, Siddarth A. Krishnan, Shishir Ray, Miaomiao Wang, James H. Stathis, Rajan K. Pandey, Tenko Yamashita, Barry P. Linder
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Materials science, Negative-bias temperature instability, Dopant, business.industry, Gate dielectric, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Engineering physics, CMOS, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0210 nano-technology, business, Metal gate, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::05871b2009b497e6ca207ca85519472c
https://doi.org/10.1109/irps.2016.7574532 -
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المؤلفون: Vamsi Paruchuri, Patrick W. DeHaven, Barry P. Linder, John Bruley, Takaaki Tsunoda, Aarthi Venkateshan, Yu Zhu, Lisa F. Edge, Sanjay Shinde, Andrew J. Kellock, Tuan Vo
المصدر: ECS Transactions. 19:263-268
مصطلحات موضوعية: chemistry.chemical_compound, Materials science, chemistry, Metallurgy, Metal electrodes, High-κ dielectric, Tantalum carbide, Characterization (materials science)
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المصدر: Microelectronics Reliability. 43:1439-1444
مصطلحات موضوعية: Materials science, business.industry, Time-dependent gate oxide breakdown, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, CMOS, Gate oxide, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business
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9
المصدر: Microelectronics Reliability. 43:1353-1360
مصطلحات موضوعية: Materials science, Reliability (semiconductor), CMOS, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Electronic circuit, Reliability engineering
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المؤلفون: James H. Stathis, Rosana Rodríguez, Barry P. Linder
المصدر: Microelectronics Reliability. 43:1193-1197
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Oxide, Electrical element, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, CMOS, chemistry, Gate oxide, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Inverter, Static random-access memory, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Hardware_LOGICDESIGN