يعرض 1 - 10 نتائج من 72 نتيجة بحث عن '"Basler, Thomas"', وقت الاستعلام: 0.81s تنقيح النتائج
  1. 1
    مؤتمر
    Prompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications

    المؤلفون: Prigann, Sven, Feil, Maximilian W., Reisinger, Hans, Bissinger, Jochen, Strasser, Marc, Waltl, Michael, Schlipf, Johannes, Kaya, Turgay, Bartholomaus, Lars, Gustin, Wolfgang, Basler, Thomas

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :394-397 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  2. 2
    مؤتمر
    Digital Twin-Based Lifetime Estimation of SiC Power Modules

    المؤلفون: Mathew, Anu, Rzepka, Sven, Heimler, Patrick, Xie, Dong, Alaluss, Mohamed, Basler, Thomas

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :478-481 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  3. 3
    مؤتمر
    Gate Switching Instability of SiC MOSFETs under Simultaneously High Drain-Source Voltage and High Frequency Acceleration

    المؤلفون: Thiele, Sven, Herrmann, Clemens, Yang, Dezhi, Neumeister, Matthias, Basler, Thomas

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :136-139 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  4. 4
    مؤتمر
    Determination of the Junction Temperature Under Load Current in GaN Power Devices with Schottky Gate Leakage Current as TSEP

    المؤلفون: Goller, Maximilian, Franke, Jorg, Lentzsch, Tobias, Lutz, Josef, Basler, Thomas, Mouhoubi, Samir, Curatola, Gilberto

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :498-501 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  5. 5
    مؤتمر
    Fault Diagnosis for the Cascaded H-Bridge Multilevel Converter Considering Fault Coupling Between Switches and Sensors

    المؤلفون: Xie, Dong, Deng, Qingli, Lin, Hongjian, Lin, Chunxu, Basler, Thomas, Ge, Xinglai

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :2970-2975 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

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  6. 6
    مؤتمر
    Analysis on the Impact of Current Ripples in Fuel Cell Electric Heavy-Duty Trucks

    المؤلفون: Gurlek, Yavuz, Joos, Oliver, Lang, Charlotte, Ackerl, Martin, Dold, Roland, Basler, Thomas, Neuburger, Martin

    المصدر: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) Power Electronics and Applications (EPE'23 ECCE Europe), 2023 25th European Conference on. :1-8 Sep, 2023

    Relation: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

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  7. 7
    مؤتمر
    IGBT and Free-Wheeling Diode Behavior during the Short Circuit Type III with varied Operation Conditions

    المؤلفون: Liu, Xing, Li, Xupeng, Lutz, Josef, Fuhrmann, Jan, Eckel, Hans-Gunter, Basler, Thomas

    المصدر: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) Power Electronics and Applications (EPE'23 ECCE Europe), 2023 25th European Conference on. :1-10 Sep, 2023

    Relation: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

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  8. 8
    مؤتمر
    Comparison of a Power Cycling Test using Repetitive Unclamped Inductive Switching for Heat Generation with the DC Power Cycling Test

    المؤلفون: Abuogo, James, Schwabe, Christian, Lutz, Josef, Basler, Thomas

    المصدر: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) Power Electronics and Applications (EPE'23 ECCE Europe), 2023 25th European Conference on. :1-8 Sep, 2023

    Relation: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

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  9. 9
    مؤتمر
    Online Threshold Voltage Monitoring at SiC Power Devices during Power Cycling Test and Possible Consequences

    المؤلفون: Heimler, Patrick, Alaluss, Mohamed, Schwabe, Christian, Liu, Xing, Lutz, Josef, Basler, Thomas

    المصدر: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) Power Electronics and Applications (EPE'23 ECCE Europe), 2023 25th European Conference on. :1-10 Sep, 2023

    Relation: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

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  10. 10
    مؤتمر
    The Impact of the Dead-Time on the Reverse Recovery Behavior of SiC-MOSFET Body Diodes

    المؤلفون: Liu, Xing, Li, Xupeng, Herrmann, Clemens, Basler, Thomas

    المصدر: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2023 35th International Symposium on. :322-325 May, 2023

    Relation: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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