المؤلفون: Bellemo, L., Bevilacqua, A.

المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 71(8):3715-3719 Aug, 2024

المؤلفون: Daliento, S., Mele, L., Spirito, P., Gialanella, L., Romano, M., Limata, B.N., Carta, R., Bellemo, L.

المصدر: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on. :1-4 2006

Relation: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (ISPSD)

المؤلفون: Daliento, S., Mele, L., Spirito, P., Gialanella, L., Romano, M., Limata, B.N., Carta, R., Bellemo, L.

المصدر: Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. Power semiconductor devices & ICs Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on. :259-262 2005

Relation: Proceedings of the 17th International Symposium on Power Semiconductor Devices & ICs

المؤلفون: Spirito, P., Daliento, S., Sanseverino, A., Gialanella, L., Romano, M., Limata, B.N., Carta, R., Bellemo, L.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(9):602-604 Sep, 2004

المؤلفون: Irace, A., Maresca, L., Mirone, P., Riccio, M., Breglio, G., Bellemo, L., Carta, R., Naretto, M., El Baradai, N., Para, I., Di Santo, N.

المصدر: In Microelectronics Reliability September 2016 64:440-446

المؤلفون: Cappelluti, F., Bonani, F., Furno, M., Ghione, G., Carta, R., Bellemo, L., Bocchiola, C., Merlin, L.

المصدر: In Microelectronics Journal March 2006 37(3):190-196

المؤلفون: Bellemo, L., Carta, R., Daliento, S., Gialanella, L., Limata, B.N., Mele, L., Romano, M., Sanseverino, A., Spirito, P.

المصدر: In Vacuum 2005 78(2):623-626

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المؤلفون: Cappelluti, Federica, Bonani, Fabrizio, Furno, M, Ghione, Giovanni, Carta, R, Bellemo, L, Bocchiola, C, Merlin, L.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2153::313f3812d094765ca001df06b24ddb3b
http://hdl.handle.net/11583/1662687