المؤلفون: Moragues, Thomas, Arguijo, Diana, Beneyton, Thomas, Modavi, Cyrus, Simutis, Karolis, Abate, Adam R., Baret, Jean-Christophe^{Aff3, Aff6}, deMello, Andrew J.^{Aff1, IDs43586023002123_cor8}, Densmore, Douglas, Griffiths, Andrew D.

المصدر: Nature Reviews Methods Primers. 3(1)

المؤلفون: Weber, O., Pigot, C., Berthelon, R., Gandolfo, A., Mattavelli, P., Jasse, J., Samanni, G., Gomiero, E., Richard, E., Grenier, J. C., Ranica, R., Chouteau, S., Beneyton, R., Duclaux, B., Beylier, C., Pelissier, D., Gallon, C., Toulouse, C., Jenny, C., Croisy, M., Borowiak, C., Haendler, S., Ogier, J.L., Batail, E., Gilibert, F., Boivin, P., Turgis, D., Conte, A., Disegni, F., Redaelli, A., Annunziata, R., Cappelletti, P., Piazza, F., Ferreira, P., Arnaud, F.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Joblot, Sylvain, Duru, Romain, Guitard, Nicolas, Lu, Vincent, Nassiet, Thomas, Beneyton, Remi, Cristiano, Fuccio, Dabertrand, Karen, Borrel, Julien, Juhel, Marc, Arevalo, Edwin, Monsieur, Frederic, Borowiak, Celine, Ghegin, Elodie, Clement, Laurent, Oudot, Evan, Rideau, Denis, Zou, Wei, Pinzelli, Luc

المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :121-124 Sep, 2018

Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

المؤلفون: Ranica, R., Berthelon, R., Gandolfo, A., Samanni, G., Gomiero, E., Jasse, J., Mattavelli, P., Sandrini, J., Querre, M., Le-Friec, Y., Poulet, J., Caubet, V., Favennec, L., Boccaccio, C., Ghezzi, G., Gallon, C., Grenier, JC., Dumont, B., Weber, O., Villaret, A., Beneyton, R., Cherault, N., Ristoiu, D., Del Medico, S., Kermarrec, O., Reynard, JP., Boivin, P., Souhaite, A., Desvoivres, L., Chouteau, S., Sassoulas, PO., Clement, L., Valery, A., Petroni, E., Turgis, D., Lippiello, A., Scotti, L., Disegni, F., Ventre, A., Ornaghi, D., De Tomasi, M., Maurelli, A., Conte, A., Arnaud, F., Redaelli, A., Annunziata, R., Cappelletti, P., Piazza, F., Ferreira, P., Gonella, R., Ciantar, E.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :28.1.1-28.1.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Gauthier, A., Chevalier, P., Avenier, G., Ribes, G., Rellier, M.-L., Campidelli, Y., Beneyton, R., Celi, D., Haury, G., Gaquiere, C.

المصدر: 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2017 IEEE. :58-61 Oct, 2017

Relation: 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

المؤلفون: Cavalcante, C., Fenouillet-Beranger, C., Batude, P., Garros, X., Federspiel, X., Lacord, J., Kerdiles, S., Royet, A. S., Acosta-Alba, P., Rozeau, O., Barral, V., Arnaud, F., Planes, N., Sassoulas, P. O., Ghegin, E., Beneyton, R., Gregoire, M., Weber, O., Guerin, C., Arnaud, L., Moreau, S., Kies, R., Romano, G., Rambal, N., Magalhaes, A., Ghibaudo, G., Colinge, J. P., Vinet, M., Andrieu, F.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Arnaud, F., Ferreira, P., Piazza, F., Gandolfo, A., Zuliani, P., Mattavelli, P., Gomiero, E., Samanni, G., Jasse, J., Jahan, C., Reynard, J. P., Berthelon, R., Weber, O., Villaret, A., Dumont, B., Grenier, J. C., Ranica, R., Gallon, C., Boccaccio, C., Souhaite, A., Desvoivres, L., Ristoiu, D., Favennec, L., Caubet, V., Delmedico, S., Cherault, N., Beneyton, R., Chouteau, S., Sassoulas, P. O., Clement, L., Boivin, P., Turgis, D., Disegni, F., Ogier, J. L., Federspiel, X., Kermarrec, O., Molgg, M., Viscuso, A., Annunziata, R., Maurelli, A., Cappelletti, P., Ciantar, E.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :24.2.1-24.2.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: David Van Assche, Thomas Beneyton, Jean‐Christophe Baret

المصدر: Droplet, Vol 2, Iss 2, Pp n/a-n/a (2023)

مصطلحات موضوعية: Descriptive and experimental mechanics, QC120-168.85

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2731-4375

URL الوصول: https://doaj.org/article/8bb28760d3d4488ba91f4051f771be2d

المؤلفون: Arnaud, F., Zuliani, P., Reynard, J.P., Gandolfo, A., Disegni, F., Mattavelli, P., Gomiero, E., Samanni, G., Jahan, C., Berthelon, R., Weber, O., Richard, E., Barral, V., Villaret, A., Kohler, S., Grenier, J.C., Ranica, R., Gallon, C., Souhaite, A., Ristoiu, D., Favennec, L., Caubet, V., Delmedico, S., Cherault, N., Beneyton, R., Chouteau, S., Sassoulas, P.O., Vernhet, A., Le Friec, Y., Domengie, F., Scotti, L., Pacelli, D., Ogier, J.L., Boucard, F., Lagrasta, S., Benoit, D., Clement, L., Boivin, P., Ferreira, P., Annunziata, R., Cappelletti, P.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :18.4.1-18.4.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

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المصدر: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :165-168 Mar, 2012

Relation: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS)