المؤلفون: Yong-Ki Cho, Dong-Min Kim, Seung-Jun Bae, Young-Sik Kim, Hyang-ja Yang, Sang-hyup Kwak, Beom-Sig Cho, Jae-Young Lee, Tae-Young Oh, Hye-Ran Kim, Byeong-Cheol Kim, Cheol-Goo Park, Yun-Seok Yang, Jeong-Don Lim, Chang-Ho Shin, Seok-Won Hwang, Min-Sang Park, Sam-Young Bang, Ji-Hoon Lim, Young-Ryeol Choi, Joo Sun Choi, Jin-Kook Kim, Dae Hyun Kim, Young-Hyun Jun, Gil-Shin Moon, Kwang-Il Park, Young-Soo Sohn, Jae-Hyung Lee, Jin-Hyun Kim, Hyun-Joong Kim

المصدر: ISSCC

مصطلحات موضوعية: Engineering, Dynamic random-access memory, business.industry, Sense amplifier, Electrical engineering, Integrated circuit, law.invention, law, Gigabit, Electrical and Electronic Engineering, business, Voltage reference, Dram, Jitter, Data transmission

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e1e0da4c841439d92cfbcf9c01b5b179
https://doi.org/10.1109/jssc.2010.2085991

المؤلفون: Tae-Young Oh, Young-Soo Sohn, Seung-Jun Bae, Min-Sang Park, Ji-Hoon Lim, Yong-Ki Cho, Dae-Hyun Kim, Dong-Min Kim, Hye-Ran Kim, Hyun-Joong Kim, Jin-Hyun Kim, Jin-Kook Kim, Young-Sik Kim, Byeong-Cheol Kim, Sang-Hyup Kwak, Jae-Hyung Lee, Jae-Young Lee, Chang-Ho Shin, Yun-Seok Yang, Beom-Sig Cho, Sam-Young Bang, Hyang-Ja Yang, Young-Ryeol Choi, Gil-Shin Moon, Cheol-Goo Park, Seok-Won Hwang, Jeong-Don Lim, Kwang-Il Park, Joo Sun Choi, Young-Hyun Jun

المصدر: 2010 IEEE International Solid-State Circuits Conference - (ISSCC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6cc843d5d0e2c1ef2d41021d7b3bedcf
https://doi.org/10.1109/isscc.2010.5433889