المؤلفون: Chack, A., Beserman, R., Stolyarova, S., Nemirovsky, Y., Weil, R.

المصدر: 21st IEEE Convention of the Electrical and Electronic Engineers in Israel. Proceedings (Cat. No.00EX377) Electrical and electronic engineers in Israel Electrical and electronic engineers in israel, 2000. the 21st ieee convention of the. :57-60 2000

Relation: 21st IEEE Convention of the Electrical and Electronic Engineers in Israel. Proceedings

المؤلفون: Stolysrova, S., El-Bahar, A., Chack, A., Orekhovsky, V., Weil, R., Beserman, R., Nemirovsky, Y.

المصدر: The 22nd Convention on Electrical and Electronics Engineers in Israel, 2002. Electrical and elctronic engineers in Israel Electrical and Electronics Engineers in Israel, 2002. The 22nd Convention of. :63-65 2002

Relation: 22nd Convention of Electrical and Electronics Engineers in Israel. Proceedings

المؤلفون: Maayan, E., Kreinin, O., Bahir, G., Salzman, J., Eyal, A., Beserman, R.

المصدر: Sixth International Conference Metalorganic Vapor Phase Epitaxy Metalorganic Vapor Phase Epitaxy, 1992. Sixth International Conference. :21-22 1992

Relation: Sixth International Conference Metalorganic Vapor Phase Epitaxy

المؤلفون: Edelman, F, Chack, A, Weil, R ^*, Beserman, R, Khait, Yu.L, Werner, P, Rech, B, Roschek, T, Carius, R, Wagner, H, Beyer, W

المصدر: In Solar Energy Materials and Solar Cells 2003 77(2):125-143

المؤلفون: Eshed, A., Zhu, J., Yan, J., Beserman, R., Weiss, A. H.

المصدر: MRS Online Proceedings Library. 696(1)

المؤلفون: Edelman, F.^Aff124, Chack, A., Weil, R., Beserman, R., Werner, P., Rech, B., Roschek, T., Beyer, W.

المصدر: MRS Online Proceedings Library. 609(1)

المؤلفون: Adoram, B, Krapf, D, Levy, M, Beserman, R, Thomas, S, Wang, K.L, Shappir, J, Sa'ar, A ^*

المصدر: In Physica E: Low-dimensional Systems and Nanostructures 2000 7(1):255-258

المؤلفون: Levy, M ^*, Kapon, R, Sa'ar, A, Beserman, R, Thierry-Mieg, V, Planel, R

المصدر: In Physica E: Low-dimensional Systems and Nanostructures 2000 7(1):245-249

المؤلفون: Khait, Yu. L., Beserman, R., Chack, A., Beyer, W.

المصدر: Journal of Applied Physics; 6/15/2005, Vol. 97 Issue 12, p123508, 4p, 1 Chart, 2 Graphs

مصطلحات موضوعية: SEMICONDUCTOR doping, CRYSTALLIZATION, PHYSICAL & theoretical chemistry, SILICON, PHYSICS

المؤلفون: Khait, Yu. L., Weil, R., Beserman, R., Edelman, F., Beyer, W., Rech, B.

المصدر: Journal of Applied Physics; 7/1/2003, Vol. 94 Issue 1, p443, 11p, 3 Diagrams

مصطلحات موضوعية: SEMICONDUCTOR films, SILICON, SEMICONDUCTORS