يعرض 1 - 10 نتائج من 407 نتيجة بحث عن '"Bez, R."', وقت الاستعلام: 1.28s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

    Relation: 2023 International Electron Devices Meeting (IEDM)

  2. 2
    مؤتمر

    المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-5 May, 2012

    Relation: 2012 4th IEEE International Memory Workshop (IMW)

  3. 3
    مؤتمر

    المصدر: 2010 IEEE International Memory Workshop Memory Workshop (IMW), 2010 IEEE International. :1-4 May, 2010

    Relation: 2010 IEEE International Memory Workshop (IMW)

  4. 4
    مؤتمر

    المصدر: 2010 IEEE International Memory Workshop Memory Workshop (IMW), 2010 IEEE International. :1-4 May, 2010

    Relation: 2010 IEEE International Memory Workshop (IMW)

  5. 5
    مؤتمر

    المؤلفون: Bez, R., Cappelletti, P.

    المصدر: IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech). VLSI Technology VLSI Technology, 2005. (VLSI-TSA-Tech). 2005 IEEE VLSI-TSA International Symposium on. :84-87 2005

    Relation: 2005 IEEE VLSI-TSA. International Symposium on VLSI Technology (VLSI-TSA-TECH)

  6. 6
    مؤتمر

    المؤلفون: Atwood, G., Bez, R.

    المصدر: 63rd Device Research Conference Digest, 2005. DRC '05. Device Research Conference Digest, 2005. DRC '05. 63rd. 1:29-33 2005

    Relation: 63rd Device Research Conference Digest, 2005

  7. 7
    مؤتمر

    المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :313-316 2005

    Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

  8. 8
    مؤتمر

    المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :742-745 2005

    Relation: International Electron Devices Meeting 2005

  9. 9
    مؤتمر

    المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :293-296 2004

    Relation: Proceedings of the 34th European Solid-State Device Research Conference

  10. 10
    مؤتمر

    المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :209-215 2004

    Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings