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1تقرير
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2
المؤلفون: de Andrade Schwerz, Claudia, 1992, Moverare, JJ, Küng, Alain, Bircher, Benjamin, Riabov, Dmitri, 1990, Nyborg, Lars, 1958
المصدر: Kvalitetssäkring och dynamisk respons genom on-line monitorering av additiv tillverkning Additive Manufacturing using Metal Pilot Line (MANUELA) Journal of Materials Research and Technology. 30:4667-4681
مصطلحات موضوعية: Defect mitigation, Defect detection, In-situ monitoring, Spatter, Oxidation, Fatigue
وصف الملف: electronic
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3
المؤلفون: de Andrade Schwerz, Claudia, 1992, Moverare, JJ, Sundar, Vishal, Bircher, Benjamin, Küng, Alain, Riabov, Dmitri, 1990, Nyborg, Lars, 1958
المصدر: Additive Manufacturing using Metal Pilot Line (MANUELA) Journal of Materials Research and Technology. 29:4200-4215
مصطلحات موضوعية: In-situ monitoring, Defects, Productivity, Fatigue, X-ray computed tomography, Spatter
وصف الملف: electronic
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4دورية أكاديمية
المؤلفون: Fortuny, J, von Gersdorff, G, Lassalle, R, Linder, M, Overbeek, J, Reinold, J, Toft, G, Timmer, A, Dress, J, Blin, P, Droz-Perroteau, C, Ehrenstein, V, Franzoni, C, Herings, R, Kollhorst, B, Moore, N, Odsbu, I, Perez-Gutthann, S, Schink, T, Rascher, K, Rasouliyan, L, Rothman, KJ, Saigi-Morgui, N, Schaller, M, Smits, E, Forstner, M, Benichou, J, Bircher, AJ, Garbe, E, Rampton, DS, Gutierrez, L
المصدر: Pharmacoepidemiology and drug safety. 30(10):1447-1457
مصطلحات موضوعية: Medicin och hälsovetenskap
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5دورية أكاديمية
المؤلفون: Carrozza, A.Aff1, Aff2, IDs12540023014604_cor1, Bircher, B. A., Aversa, A.Aff2, Aff4, Biamino, S.Aff2, Aff4
المصدر: Metals and Materials International. 29(12):3697-3714
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6دورية أكاديمية
المؤلفون: Claudia Schwerz, Johan Moverare, Alain Kung, Benjamin A. Bircher, Dmitri Riabov, Lars Nyborg
المصدر: Journal of Materials Research and Technology, Vol 30, Iss , Pp 4667-4681 (2024)
مصطلحات موضوعية: In-situ monitoring, Defect detection, Defect mitigation, Oxidation, Spatter, Fatigue, Mining engineering. Metallurgy, TN1-997
وصف الملف: electronic resource
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7دورية أكاديمية
المؤلفون: Claudia Schwerz, Johan Moverare, Vishal Sundar, Benjamin A. Bircher, Alain Küng, Dmitri Riabov, Lars Nyborg
المصدر: Journal of Materials Research and Technology, Vol 29, Iss , Pp 4200-4215 (2024)
مصطلحات موضوعية: In-situ monitoring, Defects, Spatter, Productivity, Fatigue, X-ray computed tomography, Mining engineering. Metallurgy, TN1-997
وصف الملف: electronic resource
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8دورية أكاديمية
المؤلفون: Morgan, A.S., Bircher, W.G., Dollar, A.M.
المصدر: IEEE Transactions on Robotics IEEE Trans. Robot. Robotics, IEEE Transactions on. 37(5):1553-1569 Oct, 2021
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9مؤتمر
المؤلفون: Francois, Demontoux, Junior, Tsague King, Simone, Bircher, Gilles, Ruffie, Fabrice, Bonnaudin, Jean-Pierre, Wigneron, Arnaud, Mialon, Yann, Kerr
المصدر: 2020 16th Specialist Meeting on Microwave Radiometry and Remote Sensing for the Environment (MicroRad) Microwave Radiometry and Remote Sensing for the Environment (MicroRad), 2020 16th Specialist Meeting on. :1-4 Nov, 2020
Relation: 2020 16th Specialist Meeting on Microwave Radiometry and Remote Sensing for the Environment (MicroRad)
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10دورية أكاديمية
المصدر: Journal of Biological Chemistry. 298(9)
مصطلحات موضوعية: Biochemistry and Cell Biology, Biological Sciences, Genetics, Brain Disorders, Cytoskeletal Proteins, Cytoskeleton, Guanine, Humans, Monomeric GTP-Binding Proteins, Neurodevelopmental Disorders, Spectrin, GEF, Rho GTPase, Trio family proteins, autoinhibition, neurodevelopmental disorder, spectrin repeats, Chemical Sciences, Medical and Health Sciences, Biochemistry & Molecular Biology, Biological sciences, Biomedical and clinical sciences, Chemical sciences
وصف الملف: application/pdf
URL الوصول: https://escholarship.org/uc/item/3dk4k825