المؤلفون: Gupta, G., Kanamura, M., Swenson, B., Bisi, D., Romanczyk, B., Neufeld, C., Wienecke, S., Ogino, T., Miyazaki, Y., Imanishi, K., Ikeda, J., Kamiyama, M., Guerrero, J., Labrecque, M., Prejdova, R., Cruse, B., McKay, J., Bolante, G., Wang, Z., Hosoda, T., Wu, Y., Parikh, P., Lal, R., Mishra, U.

المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2022 IEEE 34th International Symposium on. :349-352 May, 2022

Relation: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Bisi, D., Wienecke, S., Romanczyk, B., Li, H., Ahmadi, E., Keller, S., Guidry, M., De Santi, C., Meneghini, M., Meneghesso, G., Mishra, U.K., Zanoni, E.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(3):345-348 Mar, 2020

المؤلفون: Ruzzarin, M., Meneghini, M., Bisi, D., Sun, M., Palacios, T., Meneghesso, G., Zanoni, E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(8):3126-3131 Aug, 2017

المؤلفون: Meneghini, M., Meneghesso, G., Rossetto, I., Bartholomeus, J., Rampazzo, F., De Santi, C., Bisi, D., Zanoni, E.

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :77-80 Jul, 2016

Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Bisi, D., Stocco, A., Meneghini, M., Rampazzo, F., Cester, A., Meneghesso, G., Zanoni, E.

المصدر: 2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :389-392 Sep, 2014

Relation: ESSDERC 2014 - 44th European Solid State Device Research Conference

المؤلفون: Bisi, D., Meneghini, M., Stocco, A., Cibin, G., Pantellini, A., Nanni, A., Lanzieri, C., Zanoni, E., Meneghesso, G.

المصدر: 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European. :61-64 Sep, 2013

Relation: ESSDERC 2013 - 43rd European Solid State Device Research Conference

المؤلفون: Meneghini, M., Bisi, D., Marcon, D., Stoffels, S., Van Hove, M., Wu, T.-L., Decoutere, S., Meneghesso, G., Zanoni, E.

المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 29(5):2199-2207 May, 2014

المؤلفون: Bisi, D., Meneghini, M., de Santi, C., Chini, A., Dammann, M., Bruckner, P., Mikulla, M., Meneghesso, G., Zanoni, E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(10):3166-3175 Oct, 2013

المؤلفون: Bisi, D., De Santi, C., Meneghini, M., Wienecke, S., Guidry, M., Li, H., Ahmadi, E., Keller, S., Mishra, U.K., Meneghesso, G., Zanoni, E.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 39(7):1007-1010 Jul, 2018

المؤلفون: Ji, D., Li, W., Agarwal, A., Chan, S.H., Haller, J., Bisi, D., Labrecque, M., Gupta, C., Cruse, B., Lal, R., Keller, S., Mishra, U.K., Chowdhury, S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 39(7):1030-1033 Jul, 2018