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1مؤتمر
المؤلفون: Nigh, Chris, Purdy, Ruben, Li, Wei, Mitra, Subhasish, Blanton, R. D.
المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024
Relation: 2024 IEEE European Test Symposium (ETS)
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2مؤتمر
المؤلفون: Li, Wei, Wang, Fangzhou, Moura, Jose M. F., Blanton, R. D.
المصدر: 2023 60th ACM/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2023 60th ACM/IEEE. :1-6 Jul, 2023
Relation: 2023 60th ACM/IEEE Design Automation Conference (DAC)
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3مؤتمر
المؤلفون: Purdy, Ruben, Duvalsaint, Danielle, Blanton, R. D. Shawn
المصدر: 2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) Hardware Oriented Security and Trust (HOST), 2022 IEEE International Symposium on. :53-56 Jun, 2022
Relation: 2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
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4مؤتمر
المؤلفون: Purdy, Ruben, Blanton, R. D. Shawn
المصدر: 2022 23rd International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2022 23rd International Symposium on. :1-6 Apr, 2022
Relation: 2022 23rd International Symposium on Quality Electronic Design (ISQED)
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5مؤتمر
المؤلفون: Duvalsaint, Danielle, Blanton, R. D. Shawn
المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :213-222 Oct, 2021
Relation: 2021 IEEE International Test Conference (ITC)
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6مؤتمر
المؤلفون: Nigh, Chris, Bhargava, Gaurav, Blanton, R. D.
المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :314-318 Oct, 2021
Relation: 2021 IEEE International Test Conference (ITC)
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7مؤتمر
المؤلفون: Huang, Qicheng, Fang, Chenlei, Shawn Blanton, R. D.
المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020
Relation: 2020 IEEE International Test Conference (ITC)
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8مؤتمر
المؤلفون: Huang, Qicheng, Fang, Chenlei, Blanton, R. D. Shawn
المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-9 Nov, 2020
Relation: 2020 IEEE International Test Conference (ITC)
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9مؤتمر
المؤلفون: Liu, Zeye, Shawn Blanton, R. D.
المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020
Relation: 2020 IEEE International Test Conference (ITC)
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10مؤتمر
المؤلفون: Huang, Qicheng, Fang, Chenlei, Blanton, R. D. Shawn
المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :65-70 Sep, 2020
Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)