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1مؤتمر
المؤلفون: Hung-Jun An, Hyou-youn Nam, Hyun-sun Mo, Jong-pil Son, Bo-tak Lim, Sang-beom Kang, Gong-heum Han, Joon-min Park, Kyung-hee Kim, Su-yeon Kim, Choong-keun Kwak, Hyun-geun Byun
المصدر: 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) VLSI circuits VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on. :282-283 2004
Relation: 2004 Symposium on VLSI Circuits. Digest of Technical Papers
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المؤلفون: Min-Chul Han, Chang-Hun Ko, Cheol-Hwan Kim, Masayuki Terai, Hye-Sun Kim, Oh-Hun Kwon, Ji-Hyun Cheon, Jin-Woo Choi, Jung-Hoon Park, Kyu-Sul Park, Jae-Ho Pak, Do-Youn Park, Seung-Yeol Oh, Min-Su Kim, Hyun-Woo Ryoo, Myung-Chul Shin, Bo-Tak Lim, Il-Mok Park, Hyuck-Joon Kwon, Yoon-Jong Song, Jung-Yun Choi, Gwan-Hyeob Koh, Hyung-Jong Ko, Yu-Gyun Shin
المصدر: Metrology, Inspection, and Process Control XXXVII.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f86e15a85998d7c0f87f5ec1a4a28928
https://doi.org/10.1117/12.2656206 -
3
المؤلفون: Jiseong Jeong, Chang-Hun Ko, Seung-Eun Yu, Oh-Hun Kwon, Tae-Hyeong Ku, Tae Heon Kim, Dong-Won Lim, Bo-Tak Lim, Hyuck-Joon Kwon, Jung-Yun Choi, Hyung-Jong Ko
المصدر: Metrology, Inspection, and Process Control XXXVI.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::782290f4bf21e5815b573b4c4ac08a89
https://doi.org/10.1117/12.2605606 -
4
المؤلفون: Cheol-Hwan Kim, Jong-Min Lee, Ji-Chang Sim, Sang-Eun Go, Hyo-Seok Woo, Dong-Yun Kim, Oh-Hun Kwon, Bo-Tak Lim, Jae-Sun Yun, Hong-Soo Kim, Hyuck-Joon Kwon, Jung-Yun Choi, Hyung-Jong Ko
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f7627ce62368799382a61756ee41857d
https://doi.org/10.1117/12.2613625 -
5
المؤلفون: Jin-Guk Kim, Kijun Lee, Junyong Noh, Seungseob Lee, Jung-Bae Lee, Seung-Duk Baek, Jungyu Lee, Sin-Ho Kim, Soo-Young Kim, Hye-In Choi, Ki-Chul Chun, Beomyong Kil, Sanguhn Cha, So-Young Kim, Jae-Won Park, Ryu Ye-Sin, Jun Jin Kong, Dong-Hak Shin, Byung-Kyu Ho, Hyuk-Jun Kwon, Baekmin Lim, Park Yong-Sik, Seouk-Kyu Choi, Chi-Sung Oh, Kyomin Sohn, Myungkyu Lee, Kwang-Il Park, Young-Yong Byun, Jae-Wook Lee, Bo-Tak Lim, Seong-Jin Cho, Jong-Pil Son, Yong-ki Kim, Nam Sung Kim, S.J. Ahn
المصدر: ISSCC
مصطلحات موضوعية: 010302 applied physics, Scheme (programming language), Random access memory, business.industry, Computer science, Process (computing), 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, Power (physics), Stack (abstract data type), Embedded system, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Bandwidth (computing), business, Throughput (business), computer, Dram, System bus, computer.programming_language
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c5b0e5664cdb1f3d0e43a12624294aa7
https://doi.org/10.1109/isscc19947.2020.9063110 -
6
المؤلفون: Seung-Jun Bae, Jongwook Park, Young-Soo Sohn, Taesung Kim, Sewon Eom, Young-Seok Kim, Hyuck-Joon Kwon, Daesik Moon, Seong-Hwan Kim, Ki-Ho Kim, Seungseob Lee, Eungsung Seo, Jin-Hyeok Baek, Yoon-Joo Eom, Kyoung-Ho Kim, Jung-Hwan Choi, Tae-Young Oh, Gil-Hoon Cha, Seok-Hun Hyun, Yoon-Gyu Song, Youn-sik Park, Kyung-Soo Ha, Young Hoon Son, Dae-Hee Jung, In-Dal Song, Kwang-Il Park, Hyunyoon Cho, Bo-Tak Lim, Chang-Kyo Lee, Si-Hyeong Cho, Joon-Young Park, Junha Lee, Jin-Seok Heo, Young-Ryeol Choi, Seong-Jin Jang
المصدر: A-SSCC
مصطلحات موضوعية: Power supply voltage, Offset (computer science), Comparator, Computer science, Control theory, 020208 electrical & electronic engineering, Dual loop, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, Electrical impedance, Dram, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::49e6cc5f556a1c86f0e956ef3176bfec
https://doi.org/10.1109/asscc.2017.8240239 -
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المؤلفون: Seung-Hyun Cho, Seong-Jin Jang, Yoon-Sik Park, Jong-Ho Lee, Hyuk-Jun Kwon, Gyo-Young Jin, Min-Su Jang, Sung-Geun Do, Bo-Tak Lim, Beob-Rae Cho, Young-Hun Seo, Gong-Heum Han, Chul-Hee Jeon, Hyun-Soo Park, Jae-Woong Lee, Hyung-Kyu Kim, Hyoung-Ju Kim, In-Ho Im, Jae-Koo Park, Seung-Jun Bae, Jun-Young Park, Jae-Youl Lee, Chan-Yong Lee, Ki-Hun Yu, Kwang-Il Park, Su-Yeon Doo, Seung-Sub Lee, Hye-Jung Kwon, Jongwook Park, Jung-Hwan Choi, Seok-Ho Lee, Sang-Hoon Jung, Eunsung Seo, Sang-Sun Kim, Jung-Bum Shin, Hye-Ran Kim
المصدر: ISSCC
مصطلحات موضوعية: 010302 applied physics, Engineering, Hardware_MEMORYSTRUCTURES, Power gating, business.industry, Bandwidth (signal processing), Memory bandwidth, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Data retention, Standby power, business, Electrical efficiency, Wearable technology, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c0f825e2862316ff32770b6cc4b7d7eb
https://doi.org/10.1109/isscc.2017.7870427 -
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المؤلفون: Seungjin Lee, Chang-Hyun Kim, Woo-Yeong Cho, Hoi-Jun Yoo, Jerald Yoo, Chang-Sik Kim, Choong-keun Kwak, Byung-Gil Choi, Kyomin Sohn, Hyejung Kim, Bo-Tak Lim, Jeong-Ho Woo
المصدر: 2007 IEEE Symposium on VLSI Circuits.
مصطلحات موضوعية: Microcontroller, Built-in self-test, Reduced instruction set computing, Margin (machine learning), business.industry, Computer science, Parallel computing, business, Throughput (business), Cell technology, Computer hardware, Diode, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cfb82d768f9989b510c66cc66fe809c2
https://doi.org/10.1109/vlsic.2007.4342707 -
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المؤلفون: Bo-Tak Lim, Jong-Pil Son, Hung-Jun An, Kyung-Hee Kim, Hyun-Sun Mo, Gong-Heum Han, Hyou-Youn Nam, Joon-Min Park, Hyun-Geun Byun, Su-Yeon Kim, Choong-keun Kwak, Sang-beom Kang
المصدر: 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525).
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, Wafer-scale integration, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Read-write memory, Thin-film transistor, Electronic engineering, Optoelectronics, Static random-access memory, business, Low voltage, Access time, Electronic circuit, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::353872c04ef2d361058036c963f3cd94
https://doi.org/10.1109/vlsic.2004.1346588 -
10مؤتمر
المؤلفون: Kyomin Sohn, Hyejung Kim, Jerald Yoo, Jeong-Ho Woo, Seung-Jin Lee, Woo-Yeong Cho, Bo-Tak Lim, Byung-Gil Choi, Chang-Sik Kim, Choong-Keun Kwak, Chang-Hyun Kim, Hoi-Jun Yoo
المصدر: 2007 IEEE Symposium on VLSI Circuits; 2007, p184-185, 2p