المؤلفون: Hussain, T., Royter, Y., Hitko, D., Montes, M., Madhav, M., Milosavljevic, I., Rajavel, R., Thomas, S., Antcliffe, M., Arthur, A., Boegeman, Y., Sokolich, M., Li, J., Asbeck, P.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :553-556 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Thomas, S., III, Elliott, K., Chow, D.H., Rajavel, R., Deelman, P., McLaughlin, D., Boegeman, Y., Fields, C.H.

المصدر: International Semiconductor Device Research Symposium, 2003 Semiconductor device research Semiconductor Device Research Symposium, 2003 International. :344-345 2003

Relation: 2003 International Semiconductor Device Research Symposium

المؤلفون: Moyer, Harris P., Hsu, Tsung-Yuan, Bowen, R. L., Boegeman, Y. K., Deelman, P. W., Thomas III, S., Hunter, Andrew T., Schulman, Joel N., Luukanen, Arttu, Grossman, Erich N.

المصدر: Proceedings of SPIE; Nov2005, Issue 1, p84-92, 9p

المؤلفون: Hussain, T., Royter, Y., Hitko, D., Montes, M., Madhav, M., Milosavljevic, I., Rajavel, R., Thomas, S., Antcliffe, M., Arthur, A., Boegeman, Y., Sokolich, M., Li, J., Asbeck, P.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p553-556, 4p

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