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1مؤتمر
المؤلفون: Sokolich, M., Chen, M.Y., Chow, D.H., Royter, Y., Thomas III, S., Fields, C.H., Hitko, D.A., Shi, B., Montes, M., Bui, S.S., Boegeman, Y.K., Arthur, A., Duvall, J., Martinez, R., Hussain, T., Rajavel, R.D., Li, J.C., Elliott, K., Thompson, J.D.
المصدر: 25th Annual Technical Digest 2003. IEEE Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. GaAs IC symposium Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. 25th Annual Technical Digest 2003. IEEE. :219-222 2003
Relation: GaAs IC Symposium. 25th Annual Technical Digest 2003
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2مؤتمر
المؤلفون: Fay, P., Schulman, J.N., Thomas, S., III, Chow, D.H., Boegeman, Y.K., Holabird, K.S.
المصدر: Proceedings. IEEE Lester Eastman Conference on High Performance Devices High performance devices High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on. :334-342 2002
Relation: IEEE Lester Eastmann Biennial Conference
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3دورية أكاديمية
المؤلفون: Sokolich, M., Fields, C.H., Thomas, S., III., Binqiang Shi, Boegeman, Y.K., Martinez, R., Kramer, A.R., Madhav, M.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 36(9):1328-1334 Sep, 2001
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4دورية أكاديمية
المؤلفون: Broekaert, T.P.E., Jensen, J.F., Yap, D., Persechini, D.L., Bourgholtzer, S., Fields, C.H., Brown-Boegeman, Y.K., Binqiang Shi, Walden, R.H.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 36(9):1335-1342 Sep, 2001
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5دورية أكاديمية
المؤلفون: Schulman, J.N., Kolinko, V., Morgan, M., Martin, C., Lovberg, J., Thomas, S., III, Zinck, J., Boegeman, Y.K.
المصدر: IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 14(7):316-318 Jul, 2004
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6دورية أكاديمية
المؤلفون: Meyers, R.G., Fay, P., Schulman, J.N., Thomas, S., III, Chow, D.H., Zinck, J., Boegeman, Y.K., Deelman, P.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(1):4-6 Jan, 2004
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7دورية أكاديمية
المؤلفون: Fay, P., Schulman, J.N., Thomas, S., III, Chow, D.H., Boegeman, Y.K., Holabird, K.S.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 23(10):585-587 Oct, 2002
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8دورية أكاديمية
المؤلفون: Sokolich, M., Kramer, A.R., Boegeman, Y.K., Martinez, R.R.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 22(7):309-311 Jul, 2001
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9مؤتمر
المؤلفون: Moyer, H.P., Hsu, T.Y., Bowen, R.L., Boegeman, Y.K., Deelman, P.W., Thomas, S., Hunter, A.T., Schulman, J.N.
المصدر: 63rd Device Research Conference Digest, 2005. DRC '05. Device Research Conference Digest, 2005. DRC '05. 63rd. 1:263-264 2005
Relation: 63rd Device Research Conference Digest, 2005
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10مؤتمر
المؤلفون: Meyers, R.G., Fay, P., Schulman, J.N., Thomas, S., III, Chow, D.H., Boegeman, Y.K., Deelman, P.
المصدر: 61st Device Research Conference. Conference Digest (Cat. No.03TH8663) Device research conference Device Research Conference, 2003. :93-94 2003
Relation: 61st Device Research Conference
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