المؤلفون: Golonzka, O., Arslan, U., Bai, P., Bohr, M., Baykan, O., Chang, Y., Chaudhari, A., Chen, A., Clarke, J., Connor, C., Das, N., English, C., Ghani, T., Hamzaoglu, F., Hentges, P., Jain, P., Jezewski, C., Karpov, I., Kothari, H., Kotlyar, R., Lin, B., Metz, M., Odonnell, J., Ouellette, D., Park, J., Pirkle, A., Quintero, P., Seghete, D., Sekhar, M., Gupta, A.S., Seth, M., Strutt, N., Wiegand, C., Yoo, H.J., Fischer, K.

المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T230-T231 Jun, 2019

Relation: 2019 Symposium on VLSI Technology

المؤلفون: Golonzka, O., Alzate, J. -G., Arslan, U., Bohr, M., Bai, P., Brockman, J., Buford, B., Connor, C., Das, N., Doyle, B., Ghani, T., Hamzaoglu, F., Heil, P., Hentges, P., Jahan, R., Kencke, D., Lin, B., Lu, M., Mainuddin, M., Meterelliyoz, M., Nguyen, P., Nikonov, D., O'brien, K., Donnell, J.O, Oguz, K., Ouellette, D., Park, J., Pellegren, J., Puls, C., Quintero, P., Rahman, T., Romang, A., Sekhar, M., Selarka, A., Seth, M., Smith, A. J., Smith, A. K., Wei, L., Wiegand, C., Zhang, Z., Fischer, K.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :18.1.1-18.1.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Jan, C.-H., Bai, P., Choi, J., Curello, G., Jacobs, S., Jeong, J., Johnson, K., Jones, D., Klopcic, S., Lin, J., Lindert, N., Lio, A., Natarajan, S., Neirynck, J., Packan, P., Park, J., Post, I., Patel, M., Ramey, S., Reese, P., Rockford, L., Roskowski, A., Sacks, G., Turkot, B., Wang, Y., Wei, L., Yip, J., Young, I., Zhang, K., Zhang, Y., Bohr, M., Holt, B.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :60-63 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Bai, P., Auth, C., Balakrishnan, S., Bost, M., Brain, R., Chikarmane, V., Heussner, R., Hussein, M., Hwang, J., Ingerly, D., James, R., Jeong, J., Kenyon, C., Lee, E., Lee, S.-H., Lindert, N., Liu, M., Ma, Z., Marieb, T., Murthy, A., Nagisetty, R., Natarajan, S., Neirynck, J., Ott, A., Parker, C., Sebastian, J., Shaheed, R., Sivakumar, S., Steigerwald, J., Tyagi, S., Weber, C., Woolery, B., Yeoh, A., Zhang, K., Bohr, M.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :657-660 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Karl, E., Wang, Y., Ng, Y.-G., Guo, Z., Hamzaoglu, F., Meterelliyoz, M., Keane, J., Bhattacharya, U., Zhang, K., Mistry, K., Bohr, M.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 48(1):150-158 Jan, 2013

المؤلفون: Thompson, S., Anand, N., Armstrong, M., Auth, C., Arcot, B., Alavi, M., Bai, P., Bielefeld, J., Bigwood, R., Brandenburg, J., Buehler, M., Cea, S., Chikarmane, V., Choi, C., Frankovic, R., Ghani, T., Glass, G., Han, W., Hoffmann, T., Hussein, M., Jacob, P., Jain, A., Jan, C., Joshi, S., Kenyon, C., Klaus, J., Klopcic, S., Luce, J., Ma, Z., Mcintyre, B., Mistry, K., Murthy, A., Nguyen, P., Pearson, H., Sandford, T., Schweinfurth, R., Shaheed, R., Sivakumar, S., Taylor, M., Tufts, B., Wallace, C., Wang, P., Weber, C., Bohr, M.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :61-64 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Tyagi, S., Alavi, M., Bigwood, R., Bramblett, T., Brandenburg, J., Chen, W., Crew, B., Hussein, M., Jacob, P., Kenyon, C., Lo, C., McIntyre, B., Ma, Z., Moon, P., Nguyen, P., Rumaner, L., Schweinfurth, R., Sivakumar, S., Stettler, M., Thompson, S., Tufts, B., Xu, J., Yang, S., Bohr, M.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :567-570 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Ghani, T., Ahmed, S., Aminzadeh, P., Bielefeld, J., Charvat, P., Chu, C., Harper, M., Jacob, P., Jan, C., Kavalieros, J., Kenyon, C., Nagisetty, R., Packan, P., Sebastian, J., Taylor, M., Tsai, J., Tyagi, S., Yang, S., Bohr, M.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :415-418 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Wang, Y., Bhattacharya, U., Hamzaoglu, F., Kolar, P., Ng, Y.-G., Wei, L., Zhang, Y., Zhang, K., Bohr, M.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 45(1):103-110 Jan, 2010

المؤلفون: Hamzaoglu, F., Zhang, K., Wang, Y., Ahn, H. J., Bhattacharya, U., Chen, Z., Ng, Y.-G., Pavlov, A., Smits, K., Bohr, M.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 44(1):148-154 Jan, 2009