المؤلفون: Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye, Guofu Zhai

المصدر: IEEE Transactions on Reliability. 72:37-48

مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f5a22c26d67d4612154f9d6b440785f1
https://doi.org/10.1109/tr.2022.3172416

المؤلفون: Weijun Jiang, Xuerong Ye, Qisen Sun, Bokai Zheng, Guofu Zhai

المصدر: 2022 Global Reliability and Prognostics and Health Management (PHM-Yantai).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3bcf475873d08c4da3ac65cb0988714f
https://doi.org/10.1109/phm-yantai55411.2022.9942141

المؤلفون: Xuerong Ye, Yifan Hu, Bokai Zheng, Cen Chen, Guofu Zhai

المصدر: Reliability Engineering & System Safety. 228:108815

مصطلحات موضوعية: Safety, Risk, Reliability and Quality, Industrial and Manufacturing Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::24c43825b3cf17bd9583ab793a18e052
https://doi.org/10.1016/j.ress.2022.108815

المؤلفون: Bokai Zheng, Cen Chen, Wei Zhang, Rao Fu, Yifan Hu, Yigang Lin, Chunqing Wang, Guofu Zhai

المصدر: Microelectronics Reliability. 138:114640

مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::84fed8b4a518cd39b7513d7a06879fa7
https://doi.org/10.1016/j.microrel.2022.114640

المؤلفون: Yifan Hu, Xuerong Ye, Bokai Zheng, Zichuan Zhao, Guofu Zhai

المصدر: Microelectronics Reliability. 138:114609

مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4de2ea7d812f896076eb03891ee59d64
https://doi.org/10.1016/j.microrel.2022.114609

المؤلفون: Enrico Zio, Bokai Zheng, Si Shuang, Guofu Zhai, Xuerong Ye

المساهمون: Harbin Institute of Technology (HIT), Centre de recherche sur les Risques et les Crises (CRC), MINES ParisTech - École nationale supérieure des mines de Paris, Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)

المصدر: Quality and Reliability Engineering International
Quality and Reliability Engineering International, Wiley, 2021, 37 (2), pp.464-483. ⟨10.1002/qre.2744⟩

مصطلحات موضوعية: failure mechanism consistency test, 0211 other engineering and technologies, Failure mechanism, 02 engineering and technology, Management Science and Operations Research, 01 natural sciences, [SHS]Humanities and Social Sciences, Wiener process, Consistency test, 010104 statistics & probability, symbols.namesake, [SPI]Engineering Sciences [physics], 0101 mathematics, Degradation test, Safety, Risk, Reliability and Quality, individual differences, accelerated degradation test, Mathematics, technologies, 021103 operations research, [SDE.IE]Environmental Sciences/Environmental Engineering, likelihood ratio test, degradation processes, Reliability engineering, Likelihood-ratio test, failure mechannism, [SDE]Environmental Sciences, symbols

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e2b904f0c500eac8d2a1227c695f397
https://hal-mines-paristech.archives-ouvertes.fr/hal-03479280

المؤلفون: Xuerong Ye, Cen Chen, Yifan Hu, Enrico Zio, Bokai Zheng, Yigang Lin, Guofu Zhai

المصدر: Reliability Engineering & System Safety. 217:108087

مصطلحات موضوعية: Optimal design, Generalized Wiener process, Mathematical optimization, Nonlinear system, Robustness (computer science), Computer science, Statistical inference, Test plan, Safety, Risk, Reliability and Quality, Industrial and Manufacturing Engineering, Reliability (statistics), Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2057a534f78a594381f12e615199bea6
https://doi.org/10.1016/j.ress.2021.108087

المؤلفون: Bokai Zheng, Yifan Hu, Sirui Liu, Cen Chen, Xuerong Ye, Rui Feng, Guofu Zhai

المصدر: Microelectronics Reliability. 126:114277

مصطلحات موضوعية: Equivalent series resistance, Computer science, Condensed Matter Physics, Capacitance, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Power (physics), law.invention, Nonlinear system, Capacitor, Film capacitor, Control theory, law, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Reliability (statistics), Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::493c226267080f9243b9c031d6cd7af2
https://doi.org/10.1016/j.microrel.2021.114277

المؤلفون: Bokai Zheng, Shouxia Wang, Weiping He, Shuxia Wang

المصدر: HCI International 2020 – Late Breaking Papers: Virtual and Augmented Reality ISBN: 9783030599898
HCI (46)

مصطلحات موضوعية: Computer science, business.industry, Projection mapping, 020207 software engineering, 02 engineering and technology, Object (computer science), Tracking (particle physics), law.invention, Projector, law, 0202 electrical engineering, electronic engineering, information engineering, Robot, Factory (object-oriented programming), 020201 artificial intelligence & image processing, Computer vision, Artificial intelligence, business, Projection (set theory)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::05ff631332f93687278a19a0ea716a95
https://doi.org/10.1007/978-3-030-59990-4_12

المؤلفون: Shuxia Wang, Shuo Feng, Xiaoliang Bai, Shouxia Wang, Weiping He, Mark Billinghurst, Bokai Zheng

المساهمون: Wang, Shouxia, He, Weiping, Zheng, Bokai, Feng, Shuo, Wang, Shuxia, Bai, Xiaoliang, Billinghurst, Mark, 18th IEEE International Symposium on Mixed and Augmented Reality, ISMAR-Adjunct 2019 Beijing, China 14-18 October 2019

المصدر: ISMAR Adjunct

مصطلحات موضوعية: Human–computer interaction, Computer science, Interface (computing), GRASP, virtual reality, Augmented reality, 3D sketching, Virtual reality, Object (computer science), tangible interface, ComputingMethodologies_COMPUTERGRAPHICS, Graphics tablet

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6c27476467230f34081762e32bc7da8d
https://doi.org/10.1109/ismar-adjunct.2019.00-58