المؤلفون: Bolshakov, Pavel, Rodriguez-Davila, Rodolfo A., Quevedo-Lopez, Manuel, Young, Chadwin D.

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-5 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Rodriguez-Davila, Rodolfo A., Bolshakov, Pavel, Young, Chadwin D., Quevedo-Lopez, Manuel

المصدر: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :190-193 Mar, 2019

Relation: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Young, Chadwin D., Bolshakov, Pavel, Rodriguez-Davila, Rodolfo A., Zhao, Peng, Khosravi, Ava, Mejia, Israel, Quevedo-Lopez, Manuel, Hinkle, Christopher L., Wallace, Robert M.

المصدر: 2018 International Conference on IC Design & Technology (ICICDT) IC Design & Technology (ICICDT), 2018 International Conference on. :173-176 Jun, 2018

Relation: 2018 International Conference on IC Design & Technology (ICICDT)

المؤلفون: Bolshakov, Pavel, Khosravi, Ava, Zhao, Peng, Wallace, Robert M., Young, Chadwin D., Hurley, Paul K.

المصدر: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2018 IEEE International Conference on. :161-165 Mar, 2018

Relation: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Bolshakov, Pavel, Zhao, Peng, Smyth, Christopher M., Azcatl, Angelica, Wallace, Robert M., Young, Chadwin D., Hurley, Paul K.

المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-4 Mar, 2017

Relation: 2017 International Conference of Microelectronic Test Structures (ICMTS)

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Bolshakov, Pavel, Zhao, Peng, Azcatl, Angelica, Hurley, Paul K., Wallace, Robert M., Young, Chadwin D.

المصدر: In Microelectronic Engineering 25 June 2017 178:190-193

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Semenova Elena, Kharin Nikita, Bolshakov Pavel, Ivanova Anastasiya, Yaikova Viktoriya

المصدر: MATEC Web of Conferences, Vol 329, p 03077 (2020)

مصطلحات موضوعية: Engineering (General). Civil engineering (General), TA1-2040

وصف الملف: electronic resource

Relation: https://www.matec-conferences.org/articles/matecconf/pdf/2020/25/matecconf_icmtmte2020_03077.pdf; https://doaj.org/toc/2261-236X

URL الوصول: https://doaj.org/article/fdf9f4a4edbf44c6b27f71981f1c6d6c