المؤلفون: Tianshi Liu, Hua Zhang, Sundar Babu Isukapati, Emran Ashik, Adam J. Morgan, Bongmook Lee, Woongje Sung, Ayman Fayed, Marvin H. White, Anant K. Agarwal

المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 129-138 (2022)

مصطلحات موضوعية: SiC MOSFETs, CMOS circuits, smart power IC, SPICE modeling, trapped interface charges, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9709592/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/da1ff765b0fc44b8a3a07ceecf6d277a

المؤلفون: Jha, R., Bongmook Lee, Bei Chen, Novak, S., Majhi, P., Misra, V.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :43-46 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Bei Chen, Jha, R., Lazar, H., Biswas, N., Jaehoon Lee, Bongmook Lee, Wielunski, L., Garfunkel, E., Misra, V.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 27(4):228-230 Apr, 2006

المؤلفون: Yilu Zhou, Farzad Mohaddes, Courtney Lee, Smriti Rao, Amanda C. Mills, Adam C. Curry, Bongmook Lee, Veena Misra

المصدر: IEEE Sensors Journal. 22:18970-18977

مصطلحات موضوعية: Electrical and Electronic Engineering, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::88cb5030cf4acb9464a03530fc79728e
https://doi.org/10.1109/jsen.2022.3197060

المؤلفون: Hua Zhang, Tianshi Liu, Utsav Gupta, Sundar Babu Isukapati, Emran Ashik, Adam J. Morgan, Bongmook Lee, Woongje Sung, Anant K. Agarwal, Ayman Fayed

المصدر: 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cf18c5af209d33e3d0f5f5cf333018c3
https://doi.org/10.1109/mwscas54063.2022.9859305

المؤلفون: Emran K Ashik, Sundar B Isukapati, Hua Zhang, Tianshi Liu, Utsav Gupta, Adam J Morgan, Veena Misra, Woongje Sung, Ayman Fayed, Anant K. Agarwal, Bongmook Lee

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::070f6eac0d77daabb9ef2617fb8dcaa6
https://doi.org/10.1109/irps48227.2022.9764565

المؤلفون: Bongmook Lee, Akhilesh Tanneeru, Veena Misra, Faisal Azam

المصدر: IEEE Transactions on Electron Devices. 67:881-887

مصطلحات موضوعية: 010302 applied physics, Materials science, Transconductance, Analytical chemistry, Wide-bandgap semiconductor, chemistry.chemical_element, Algan gan, Dielectric, 01 natural sciences, Electronic, Optical and Magnetic Materials, Hafnium, Atomic layer deposition, Lower threshold, chemistry, 0103 physical sciences, Electrical and Electronic Engineering, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5805ddca594468449b6da79715566637
https://doi.org/10.1109/ted.2020.2969394

المؤلفون: Sundar Babu Isukapati, Adam J Morgan, Woongje Sung, Hua Zhang, Tianshi Liu, Ayman Fayed, Anant K. Agarwal, Emran Ashik, Bongmook Lee

المصدر: 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e0c861e94cce2692135940238c6aea5f
https://doi.org/10.1109/wipda49284.2021.9645134

المؤلفون: Tahmid Latif, James Dieffenderfer, Akhilesh Tanneeru, Bongmook Lee, Veena Misra, Alper Bozkurt

المصدر: 2021 IEEE Sensors.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54b67cc1d61b8721beb48672ff9c9e81
https://doi.org/10.1109/sensors47087.2021.9639530

المؤلفون: Bongmook Lee, Michael Lim, Veena Misra

المصدر: 2021 IEEE Sensors.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::74cf87e9f05fd91cd91329cf66c5611b
https://doi.org/10.1109/sensors47087.2021.9639471