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المؤلفون: Xinwang Liu, Tom Herrmann, G. Festes, B. Bertello, Yuri Tkachev, Boris Bayha, M. Duggan, Ralf Richter, Alban Zaka, Decobert Catherine, Thomas Melde, S. Wittek, Stefan Dunkel, N. Do, P. Ghazav, N. Bollon, F. Mauersberger, Sven Beyer, Kim Jinho, Viktor Markov, B. Muller, Zhou Feng, S. Jourba, M. Trentzsch
المصدر: 2020 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: 010302 applied physics, Computer science, business.industry, Transistor, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, law.invention, Flash (photography), Reliability (semiconductor), CMOS, Memory cell, law, 0103 physical sciences, Process integration, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Data retention, Metal gate, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::68d6b99bb8692b55d9511f87f7674fd4
https://doi.org/10.1109/imw48823.2020.9108118 -
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المؤلفون: Johannes Müller, El Mehdi Bazizi, Jochen Poth, Tom Herrmann, Hoon Kim, K. Mothes, Boris Bayha, Stefan Dunkel, Alban Zaka, Kim Jinho, N. Do, Lemke Steven, Henry A. O'm'mani, Martin Mazur, R. Huselitz, Peter Krottenthaler, Sven Beyer, S. Jansen, Parviz Ghazavi, M. Trentzsch, A. Henke, Zhou Feng, Xinwang Liu, P. Moll, Jan Paul, Yuri Tkachev, Tiwari Vipin, Ralf Richter
المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Bit cell, Cost efficiency, business.industry, Computer science, Transistor, Electrical engineering, 01 natural sciences, law.invention, Flash (photography), Reliability (semiconductor), law, 0103 physical sciences, business, Metal gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1f87d0d5543f568cc29c20e10141511f
https://doi.org/10.1109/iedm.2018.8614652 -
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المؤلفون: Boris Bayha, Martin Trentzsch, Xinggong Wan, Sandhya Chandrashekhar, Torben Balzer, M. Siddabathula, Oliver Aubel
المصدر: Microelectronics Reliability. 54:2306-2309
مصطلحات موضوعية: Materials science, Dielectric strength, business.industry, Doping, Gate dielectric, Oxide, Time-dependent gate oxide breakdown, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Reliability (semiconductor), chemistry, CMOS, Gate oxide, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business
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المؤلفون: Jürgen Niess, Boris Bayha, Georg Roters, Michael Raab, Christoph Kirchner, Rolf Stephan, Susanne Ohsiek, Tilo Mantei, Karsten Wieczorek, Martin Trentzsch, Waltraud Dietl, Zsolt Nenyei, Christian Golz, Wilfried Lerch
المصدر: Materials Science Forum. :153-163
مصطلحات موضوعية: Materials science, business.industry, Mechanical Engineering, Gate dielectric, Analytical chemistry, Plasma, Dielectric, Condensed Matter Physics, Plasma nitridation, Thermal nitridation, Reliability (semiconductor), Mechanics of Materials, Thermal, Optoelectronics, General Materials Science, business, Nitriding
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7e72e09f36cc4629a5f8e38e665aadfc
https://doi.org/10.4028/www.scientific.net/msf.573-574.153