المؤلفون: Traiola, Marcello, Pappalardo, Salvatore, Piri, Ali, Ruospo, Annachiara, Deveautour, Bastien, Sanchez, Ernesto, Bosio, Alberto, Saeedi, Sepide, Carpegna, Alessio, Gogebakan, Anil Bayram, Magliano, Enrico, Savino, Alessandro

المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-10 May, 2024

Relation: 2024 IEEE European Test Symposium (ETS)

المؤلفون: Ahmadilivani, Mohammad Hasan, Bosio, Alberto, Deveautour, Bastien, Santos, Fernando Fernandes Dos, Guerrero-Balaguera, Juan-David, Jenihhin, Maksim, Kritikakou, Angeliki, Sierra, Robert Limas, Pappalardo, Salvatore, Raik, Jaan, Condia, Josie E. Rodriguez, Reorda, Matteo Sonza, Taheri, Mahdi, Traiola, Marcello

المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-11 Apr, 2024

Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

المؤلفون: Bosio, A., Gomes, M., Pavanello, F., Porsia, A., Ruospo, A., Sanchez, E., Vatajelu, E. I.

المصدر: 2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-10 Apr, 2024

Relation: 2024 IEEE 25th Latin American Test Symposium (LATS)

المؤلفون: Taheri, Mahdi, Daneshtalab, Masoud, Raik, Jaan, Jenihhin, Maksim, Pappalardo, Salvatore, Jimenez, Paul, Deveautour, Bastien, Bosio, Alberto

المصدر: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Design & Diagnostics of Electronic Circuits & Systems (DDECS), 2024 27th International Symposium on. :19-24 Apr, 2024

Relation: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)

المؤلفون: Chen, Tony G., Newdick, Stephanie, Di, Julia, Bosio, Carlo, Ongole, Nitin, Lapotre, Mathieu, Pavone, Marco, Cutkosky, Mark R.

المصدر: Science Robotics 2024

مصطلحات موضوعية: Computer Science - Robotics

URL الوصول: http://arxiv.org/abs/2407.00973

المؤلفون: de Queiroz, Mauricio Gomes, Jimenez, Paul, Cardoso, Raphael, Costa, Mateus Vidaletti, Abdalla, Mohab, O'Connor, Ian, Bosio, Alberto, Pavanello, Fabio

مصطلحات موضوعية: Computer Science - Emerging Technologies, Computer Science - Artificial Intelligence, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2406.18757

المؤلفون: Barucci, Andrea, Ciacci, Giulia, Liò, Pietro, Azevedo, Tiago, Di Cencio, Andrea, Merella, Marco, Bianucci, Giovanni, Bosio, Giulia, Casati, Simone, Collareta, Alberto

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2405.04189

المؤلفون: Pappalardo, Salvatore, Piri, Ali, Ruospo, Annachiara, O'Connor, Ian, Deveautour, Bastien, Sanchez, Ernesto, Bosio, Alberto

المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Mannaa, S., Poittevin, A., Marchand, C., Deleruyelle, D., Deveautour, B., Bosio, A., O'Connor, I., Mukherjee, C., Wang, Y., Rezgui, H., Deng, M., Maneux, C., Muller, J., Pelloquin, S., Moustakas, K., Larrieu, G.

المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits IEEE J. Explor. Solid-State Comput. Devices Circuits Exploratory Solid-State Computational Devices and Circuits, IEEE Journal on. 9(2):116-123 Dec, 2023

المؤلفون: Bosio, Roberto, Brignone, Giovanni, Minnella, Filippo, Jamal, M. Usman, Lavagno, Luciano

المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-2 Mar, 2024

Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)