المؤلفون: Berrached, C., Bouw, D., Camiade, M., Barataud, D.

المصدر: 2013 European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2013 European. :424-427 Oct, 2013

Relation: 2013 European Microwave Integrated Circuit Conference (EuMIC)

المؤلفون: Floriot, D., Blanck, H., Bouw, D., Bourgeois, F., Camiade, M., Favede, L., Hosch, M., Jung, H., Lambert, B., Nguyen, A., Riepe, K., Splettstosse, J., Stieglauer, H., Thorpe, J., Meiners, U.

المصدر: 2012 7th European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2012 7th European. :317-320 Oct, 2012

Relation: 2012 European Microwave Integrated Circuit Conference (EuMIC)

المؤلفون: Dechansiaud, A., Sommet, R., Reveyrand, T., Quere, R., Chang, C., Bouw, D., Camiade, M., Deborgies, F.

المصدر: 2011 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC), 2011 Workshop on. :1-4 Apr, 2011

Relation: 2011 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC)

المؤلفون: Van de Casteele, J., Stuhldreier, H., Bouw, D., Gourdon, C., Raoult, M., Durand, E., Van Den Berghe, S., Hollmer, M., Grunwald, M., Lambert, B., Blanck, H., Barnes, A.

المصدر: In Microelectronics Reliability November 2020 114

المؤلفون: Huet, T., Gruenenpuett, J., Ouarch, Z., Bouw, D., Serru, V., Camiade, M., Chang, C., Chaumas, P.

المصدر: 2008 38th European Microwave Conference Microwave Conference, 2008. EuMC 2008. 38th European. :289-292 Oct, 2008

Relation: 2008 38th European Microwave Conference (EuMC)

المؤلفون: Lefebvre, B., Bouw, D., Lhortolary, J., Chang, C., Tranchant, S., Camiade, M.

المصدر: 2007 IEEE/MTT-S International Microwave Symposium Microwave Symposium, 2007. IEEE/MTT-S International. :825-828 Jun, 2007

Relation: 2007 IEEE/MTT-S International Microwave Symposium

المؤلفون: Barnes, A., Heliere, F., Villar, P., Stuhldreier, H., Beaurain, C., Bouw, D., Grunwald, M., Moess, E., Muck, T., Schildbach, C., Ayles, T., Kramer, A., Bildner, B.

المصدر: In Microelectronics Reliability September 2018 88-90:378-384

المؤلفون: Déchansiaud, Adeline, Sommet, Raphaël, Reveyrand, Tibault, Chang, C., Bouw, D., Camiade, M., Deborgies, F., Quéré, Raymond

المساهمون: Maury, Véronique, C2S2, XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: 17eme Journées Nationales Micro-ondes (JNM)
17eme Journées Nationales Micro-ondes (JNM), May 2011, Brest, France. pp.1C3

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a37ff0d498e52012e02ea412a8d9292e
https://hal.archives-ouvertes.fr/hal-00700384

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المؤلفون: Nauwelaers, Bart, van Vliet, Frank E., le Chevalier, François, Déchansiaud, A., Sommet, R., Reveyrand, T., Bouw, D., Chang, C., Camiade, M., Deborgies, F., Quéré, R.

المصدر: International Journal of Microwave & Wireless Technologies; Jun2013, Vol. 5 Issue 3, p261-269, 9p