يعرض 1 - 10 نتائج من 174 نتيجة بحث عن '"Bragaglio, A."', وقت الاستعلام: 1.44s تنقيح النتائج
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    مؤتمر

    المصدر: 2022 IEEE 23rd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2022 IEEE 23rd. :1-6 Sep, 2022

    Relation: 2022 IEEE 23rd Latin American Test Symposium (LATS)

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    مؤتمر

    المصدر: 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC) Very Large Scale Integration (VLSI-SoC), 2021 IFIP/IEEE 29th International Conference on. :1-6 Oct, 2021

    Relation: 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)

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    مؤتمر

    المصدر: 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC) Very Large Scale Integration (VLSI-SOC), 2020 IFIP/IEEE 28th International Conference on. :111-116 Oct, 2020

    Relation: 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC)

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    كتاب إلكتروني

    المؤلفون: Bragaglio, MorenoAff20, Germiniani, SamueleAff20, Pravadelli, GrazianoAff20

    المساهمون: Rannenberg, Kai, Editor-in-ChiefAff1, Soares Barbosa, Luís, Editorial Board MemberAff2, Goedicke, Michael, Editorial Board MemberAff3, Tatnall, Arthur, Editorial Board MemberAff4, Neuhold, Erich J., Editorial Board MemberAff5, Stiller, Burkhard, Editorial Board MemberAff6, Tröltzsch, Fredi, Editorial Board MemberAff7, Pries-Heje, Jan, Editorial Board MemberAff8, Kreps, David, Editorial Board MemberAff9, Reis, Ricardo, Editorial Board MemberAff10, Aff17, Furnell, Steven, Editorial Board MemberAff11, Mercier-Laurent, Eunika, Editorial Board MemberAff12, Winckler, Marco, Editorial Board MemberAff13, Malaka, Rainer, Editorial Board MemberAff14, Grimblatt, Victor, editorAff15, Chang, Chip Hong, editorAff16, Chattopadhyay, Anupam, editorAff18, Calimera, Andrea, editorAff19

    المصدر: VLSI-SoC: Technology Advancement on SoC Design : 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Singapore, October 4–8, 2021, Revised and Extended Selected Papers. 661:71-92

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