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المؤلفون: Constantinos Hatzoglou, Gérald Da Costa, Peter Wells, Xiaochen Ren, Brian P Geiser, David J Larson, Remi Demoulin, Kasper Hunnestad, Etienne Talbot, Baishakhi Mazumder, Dennis Meier, François Vurpillot
المساهمون: Groupe de physique des matériaux (GPM), Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS), Department of Materials Science and Engineering [Trondheim] (IMA NTNU), Norwegian University of Science and Technology [Trondheim] (NTNU), Norwegian University of Science and Technology (NTNU)-Norwegian University of Science and Technology (NTNU), Intel Corporation [Hillsboro], Intel Corporation [USA], Cameca, University at Buffalo [SUNY] (SUNY Buffalo), State University of New York (SUNY)
المصدر: Microscopy and Microanalysis
Microscopy and Microanalysis, 2023, 29 (3), pp.1124-1136. ⟨10.1093/micmic/ozad054⟩مصطلحات موضوعية: multilayered structure, atom probe tomography, field evaporation simulation, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], dynamic reconstruction, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef92547619e485f3f3b5fa590dcf0cf0
https://normandie-univ.hal.science/hal-04152106 -
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المؤلفون: Paul van der Heide, Brian P. Geiser, Wilfried Vandervorst, Jeroen E. Scheerder, Claudia Fleischmann, JH Bunton, Robert M. Ulfig, David Larson, Jonathan Op de Beeck
المصدر: Microscopy and Microanalysis. 28:1141-1149
مصطلحات موضوعية: Optics, Materials science, law, business.industry, Atom probe, business, Instrumentation, Common emitter, law.invention
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المؤلفون: David A Reinhard, Katherine P Rice, Robert M Ulfig, Isabelle Martin, Brian P Geiser, David J Larson
المصدر: Microscopy and Microanalysis. 28:706-708
مصطلحات موضوعية: Instrumentation
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المؤلفون: David A Reinhard, Daniel Lenz, Isabelle Martin, Ty J Prosa, Robert M Ulfig, Peter H Clifton, Brian P Geiser, Joseph H Bunton, David J Larson
المصدر: Microscopy and Microanalysis. 28:3188-3189
مصطلحات موضوعية: Instrumentation
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المؤلفون: James E Payne, David A Reinhard, Tim R Payne, Eric Strennen, Brian P Geiser
المصدر: Microscopy and Microanalysis. 28:730-731
مصطلحات موضوعية: Instrumentation
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المؤلفون: Brian P Geiser, David Reinhard, Joseph Bunton, David Larson, Robert Ulfig, Katherine P Rice, Isabelle Martin, Yimeng Chen, Ty Prosa, Tim Payne
المصدر: Microscopy and Microanalysis. 28:704-705
مصطلحات موضوعية: Instrumentation
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المؤلفون: Robert Ulfig, Daniel Lenz, Gard Groth, Joseph H Bunton, Isabel Martin, Ty J Prosa, David A Reinhard, Peter H Clifton, Brian P Geiser, David J Larson
المصدر: Microscopy and Microanalysis. 28:3190-3191
مصطلحات موضوعية: Instrumentation
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المؤلفون: Joe Bunton, Brian P. Geiser, D Lenz, Peter H. Clifton, Ty J. Prosa, David A. Reinhard, David J. Larson, I. Martin, Robert M. Ulfig
المصدر: Microscopy and Microanalysis. 27:2464-2466
مصطلحات موضوعية: Materials science, Nuclear magnetic resonance, law, Atom probe, Instrumentation, law.invention
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المؤلفون: Jeroen E. Scheerder, Claudia Fleischmann, Michael P. Moody, Brian P. Geiser, Charles Fletcher, Daniel Haley
المصدر: Microscopy and Microanalysis. 27:404-406
مصطلحات موضوعية: Materials science, Field (physics), law, Evaporation, Atom probe, Atomic physics, Instrumentation, law.invention
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المؤلفون: I. Martin, D Lenz, Robert M. Ulfig, Brian P. Geiser, David A. Reinhard, Joe Bunton, David J. Larson, Ty J. Prosa, Peter H. Clifton
المصدر: Microscopy and Microanalysis. 27:2038-2040
مصطلحات موضوعية: Materials science, Optics, business.industry, law, Instrumentation (computer programming), Atom probe, business, Instrumentation, law.invention