المؤلفون: Yu, H.Y., Chen, J.D., Li, M.F., Lee, S.J., Kwong, D.L., van Dal, M., Kittl, J.A., Lauwers, A., Augendre, E., Kubicek, S., Zhao, C., Bender, H., Brijs, B., Geenen, L., Benedetti, A., Absil, P., Jurczak, M., Biesemans, S.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :630-633 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Heyns, M., Beckx, S., Bender, H., Blomme, P., Boullart, W., Brijs, B., Carter, R., Caymax, M., Claes, M., Conard, T., De Gendt, S., Degraeve, R., Delabie, A., Deweerdt, W., Groeseneken, G., Henson, K., Kauerauf, T., Kubicek, S., Lucci, L., Lujan, G., Mentens, J., Pantisano, L., Petry, J., Richard, O., Rohr, E., Schram, T., Vandervorst, W., Van Doorne, P., Van Elshocht, S., Westlinder, J., Witters, T., Zhao, C., Cartier, E., Chen, J., Cosnier, V., Green, M., Jang, S.E., Kaushik, V., Kerber, A., Kluth, J., Lin, S., Tsai, W., Young, E., Manabe, Y., Shimamoto, Y., Bajolet, P., De Witte, H., Maes, J.W., Date, L., Pique, D., Coenegrachts, B., Vertommen, J., Passefort, S.

المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :247-250 2003

Relation: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers

المؤلفون: Vandervorst, W., Brijs, B., Bender, H., Conard, O.T., Petry, J., Richard, O., Van Elshocht, S., Delabie, A., Caymax, M., De Gendt, S., Cosnier, V., Green, M., Chen, J.

المصدر: 2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :40-50 2003

Relation: 2003 8th International Symposium on Plasma- and Process-Induced Damage

المؤلفون: Collart, E.J.H., Kirkwood, D., Van den Berg, J.A., Werner, M., Vandervorst, W., Brijs, B., Bailey, P., Noakes, T.C.Q.

المصدر: Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on Ion implantation technology proceedings Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on. :147-150 2002

Relation: Proceedings of the 2002 14th International Conference on Ion Implantation Technology

المؤلفون: Bender, H., Conard, T., Nohira, H., Petry, J., Richard, O., Zhao, C., Brijs, B., Besling, W., Detavernier, C., Vandervorst, W., Caymax, M., De Gendt, S., Chen, J., Kluth, J., Tsai, W., Maes, J.W.

المصدر: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) Gate insulator Gate Insulator, 2001. IWGI 2001. Extended Abstracts of International Workshop on. :86-92 2001

Relation: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001

المؤلفون: Rusu, C., Sedky, S., Parmentier, B., Verbist, A., Richard, O., Brijs, B., Geenen, L., Witvrouw, A., Larmer, F., Fischer, F., Kronmuller, S., Leca, V., Otter, B.

المصدر: Journal of Microelectromechanical Systems J. Microelectromech. Syst. Microelectromechanical Systems, Journal of. 12(6):816-825 Dec, 2003

المؤلفون: Menou, N., Wang, X.P., Kaczer, B., Polspoel, W., Popovici, M., Opsomer, K., Pawlak, M. A., Knaepen, W., Detavernier, C., Blomberg, T., Pierreux, D., Swerts, J., Maes, J. W., Favia, P., Bender, H., Brijs, B., Vandervorst, W., Van Elshocht, S., Wouters, D. J., Biesemans, S., Kittl, J. A.

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Lauwers, A., Mertens, S., Absil, P., Chiarella, T., Hoffmann, T., Kubicek, S., de Marneffe, J.F., Brijs, B., Vrancken, C., Biesemans, S., Kittl, J., Verheyden, K., Vanormelingen, K., Granneman, E.

المصدر: 2007 15th International Conference on Advanced Thermal Processing of Semiconductors Advanced Thermal Processing of Semiconductors, 2007. RTP 2007. 15th International Conference on. :111-117 Oct, 2007

Relation: 2007 15th International Conference on Advanced Thermal Processing of Semiconductors

المؤلفون: Proost, J., Li, H., Brijs, B., Witvrouw, A., Maex, K.

المصدر: Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102) Interconnect technology Interconnect Technology Conference, 1998. Proceedings of the IEEE 1998 International. :110-112 1998

Relation: Proceedings of the IEEE 1998 International Interconnect Technology Conference

المؤلفون: Kittl, J.A., Lauwers, A., Hoffmann, T., Veloso, A., Kubicek, S., Niwa, M., van Dal, M.J.H., Pawlak, M.A., Demeurisse, C., Vrancken, C., Brijs, B., Absil, P., Biesemans, S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 27(8):647-649 Aug, 2006